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Displaying 51 - 75 of 2903

Advances in source technology for focused ion beam instruments

April 1, 2014
Author(s)
Noel Smith, John Notte, Adam V. Steele
… Owing to the development of new ion source technology, users of focused ion beams (FIBs) have an increasingly wide array of uniquely … capable platforms to choose from. Specifically, the new ion sources are able to offer superior performance in several … ion sources, focused ion beams, inductively coupled plasma, …

Motional Squeezing for Trapped Ion Transport and Separation

August 20, 2021
Author(s)
Robert Sutherland, Shaun Burd, Daniel Slichter, Stephen Libby, Dietrich Leibfried
… Transport, separation, and merging of trapped ion crystals are essential operations for most large-scale … framework, we develop a new, general protocol for trapped ion transport, separation, and merging. We show that motional squeezing can prepare an ion wave packet to enable transfer from the ground state of …

Negative Cesium Sputter Ion Source for Generating Cluster Primary Ion Beams for Secondary Ion Mass Spectrometry Analysis

April 1, 2001
Author(s)
John G. Gillen, R L. King, B Freibaum, R Lareau, J Bennett, F Chmara
… The use of a cluster (or polyatomic) primary ion projectile for organic SIMS has been demonstrated to … use of a commercially available negative cesium sputter ion as a means of generating cluster ion beams on our Cameca IMS 4F and 6F magnetic sector SIMS … cluster beam, depth profiling, organic secondary ion mass spectrometry …

IREX IV: Part 2 Compression Profiles for Iris Image Compression

January 23, 2014
Author(s)
George Quinn, Patrick Grother, Mei Ngan, Nick Rymer
… The IREX IV evaluation builds upon IREX III as a performance test of … recognition. This report is the second part of the IREX IV evaluation, which specifically, evaluates the ability of … IREX IV: Part 2 Compression Profiles for Iris Image Compression …

Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology

January 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
… The Helium Ion Microscope (HIM) offers a new, potentially disruptive … the helium ions, it is theoretically possible to focus the ion beam into a smaller probe size relative to that of an … achievable. In contrast to the SEM, when the helium ion beam interacts with the sample, it generates …

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
… Nanoscale focused ion beams (FIBs) represent one of the most useful tools in … ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with … the brightness of the industry standard Ga+ liquid metal ion source. In this review we discuss the context of ion beam …

Trapped Highly Charged Ion Plasmas

January 1, 2002
Author(s)
E Takacs, John D. Gillaspy
… Electron beam Ion Trap (EBIT) devices are reviewed with special attention to applications in highly charged ion plasma research. EBIT properties are presented based on … parameter, Brillouin radius, magnetic trapping mode, ion cloud shape, density, temperature, rotation, and …

Capture of Highly Charged Ions in a Pseudo-Hyperbolic Paul Trap

July 12, 2019
Author(s)
Joan M. Dreiling, Aung Naing, Joseph Tan, Joshua Hanson, Shannon Hoogerheide, Samuel Brewer
… The confinement of ions in a radio-frequency (RF) trap (also known as a Paul … can be created in situ within the ion trap. Highly charged ions, on the other hand, are produced efficiently in … here, phase-space-optimized bunches of highly charged ions produced by an electron beam ion trap/source are …

Crystal Structure of the Class IV Adenylyl Cyclase From Yersinia Pestis

March 1, 2006
Author(s)
N Smith, Sung Kim, Prasad T. Reddy, David T. Gallagher
… ABSTRACT: The crystal structure of the class IV adenylyl cyclase from Yersinia pestis is reported at 1.9 resolution. The class IV fold is distinct from the previously described folds for class II and class III ACs. The dimeric Yp AC-IV folds into an antiparallel 8-stranded barrel whose …

Optimal Ion Trapping Experiment

May 10, 2007
Author(s)
Kevin J. Coakley
… because it goes dead after detecting the first trapped ion. There is a dead time {\delta} between the end of the … ion traps, probability theory, statistics … Optimal Ion Trapping Experiment …

Model for the Asymmetric DC and Fluctuating Conduction of an Ion Channel

October 16, 2008
Author(s)
B Robertson, John J. Kasianowicz
… A model for the asymmetric DC conduction of an ion channel is compared with measurements of the ionic … carried by an aqueous potassium chloride solution through ion channels formed by alpha hemolysin in a lipid bilayer. … and salt concentration is given. A model for the noise in ion conduction is also formulated. The randomness of proton …

Fast Ground State to Ground State Separation of Small Ion Crystals

October 10, 2024
Author(s)
Tyler Gugliemo, Dietrich Leibfried, Stephen Libby, Daniel Slichter
… into different subsets is critical for realizing trapped ion quantum computing architectures where ions are rearranged … suitable for separation of a mixed-species three-ion crystal on timescales similar to that of free expansion … trapped ions, quantum information, ion separation, mixed species …

Transport dynamics of single ions in segmented microstructured Paul trap arrays

August 4, 2006
Author(s)
Rainer Reichle, Dietrich G. Leibfried, Brad R. Blakestad, Joseph W. Britton, John D. Jost, Emanuel H. Knill, C. Langer, R Ozeri, Signe Seidelin, David J. Wineland
… It was recently proposed to use small groups of trapped ions as qubit carriers in miniaturized electrode arrays that … a large number of individual trapping zones, between which ions could be moved. This approach might be scalable for … of quantum information is achieved by transporting ions to and from separate memory and qubit manipulation zones …

Evidence for multiple mechanisms underlying surface-electric field noise in ion traps

December 27, 2018
Author(s)
J. A. Sedlacek, J. Stuart, Daniel Slichter, C. D. Bruzewicz, R. McConnell, J. M. Sage, J. Chiaverini
… Energetic ion bombardment, or ion milling, of ion-trap electrode surfaces has previously been shown to … Here, using motional heating of a single trapped strontium ion, we investigate the temperature dependence of this noise … anomalous heating, electric field noise, ion milling, ion trap …

Mobilities and Formation Kinetics of NH 4 + (NH 3 ) n Cluster Ions (n=0-3) in helium and helium/ammonia mixtures

January 1, 1997
Author(s)
M Krishnamurthy, J A. de Gouw, L N. Ding, V M. Bierbaum, S R. Leone
… NH 4 + (NH 3 ) n (n=1-3) cluster ions are formed in a field free flow tube section of a … measurements. The zero-field mobilities of the cluster ions in helium (22.1 +or-}0.3 cm 2 V -1 s -1 for NH 4 + , … of the geometric cross sections of the different cluster ions. The zero-field mobilities of NH 4 + (0.94 +or-} 0.15 cm …

Microfabricated Chip Traps for Ions

April 12, 2011
Author(s)
Jason Amini, Joseph W. Britton, Dietrich G. Leibfried, David J. Wineland
… ions, traps, microfabrication … Microfabricated Chip Traps for Ions …

A Focused Chromium Ion Beam

October 21, 2010
Author(s)
Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland, Jon Orloff
… With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated … of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into … to energies between 0.5 keV and 3 keV. The accelerated ion beam is scanned with a dipolar deflector and focused onto …

Inelastic Neutron Scattering on Polymer Electrolytes for Lithium-Ion Batteries

May 7, 2012
Author(s)
Huagen H. Peng, Madhu Sudan Tyagi, Kirt A. Page, Christopher Soles
… The relationship between ion transport and polymer dynamics is central to the pursuit … solid polymer electrolyte systems of sufficiently high ion conductivities. Solid polymer electrolytes are highly … liquid electrolytes that are used today in commercial Li+ ion battery systems. Here we introduce inelastic neutron …

The Use of an SF5+ Primary Ion Beam for Ultra Shallow Depth Profiling on an Ion Microscope SIMS Instrument

October 16, 2008
Author(s)
J Greg Gillen, Marlon L. Walker, P E. Thompson, J Bennett
… has been fitted with a modified hot filament duoplasmatron ion source for generation of SF 5 + primary ion beams for SIMS depth profiling applications. The SF 5 + primary ion beam has been evaluated by depth profiling of several low … polyatomic primary ions, secondary ion mass spectrometry, sulfur hexafluoride, ultra shallow …

Laser Cooling of Trapped Ions

January 1, 1991
Author(s)
Wayne M. Itano, James C. Bergquist, John J. Bollinger, David J. Wineland
… Fermi Summer School, Laser Manipulation of Atoms and Ions … Enrico Fermi Summer School, Laser Manipulation of Atoms and Ions … Laser Cooling of Trapped Ions …

Mobilities of aromatic ions drifting in helium

October 12, 2021
Author(s)
M Krishnamurthy, J A. de Gouw, V M. Bierbaum, S R. Leone
… tube (SIFDT) apparatus. The reduced mobilities of these ions in helium are measured as a function of the … in the drift tube). The reduced mobilites of the dimer ions are compared with the measured mobilities of naphthalene … cross sections computed from the geometric structures of ions using a hard sphere model. The results suggest that the …
Displaying 51 - 75 of 2903
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