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NIST Authors in Bold

Displaying 576 - 600 of 2521

X-Ray Transition Energies: New Approach to a Comprehensive Evaluation

January 1, 2003
Author(s)
R Deslattes, Ernest G. Kessler, Paul Indelicato, L de Billy, E Lindroth, J Anton
… programs of parallel development extending over more than 20 years. At each of several progressively more refined … the case for a few isolated elements and transitions for 20

Friction Measurements of Ultra-Thin Carbon Overcoats in Air

April 1, 2002
Author(s)
P M. McGuiggan, C S. Bhatia, D Bogy, W Fong, Stephen M. Hsu
… was independent of the pressure for pressures less than 20 MPa. Water acts as a lubricant decreasing the friction … adsorbed from air, at least at the pressures less than 20 MPa and a velocity of 1 um/s. At 100% humidity, the shear …

Information Technology Measurement and Testing Activities at NIST

February 1, 2001
Author(s)
David Flater, James E. Fowler, Simon P. Frechette, Craig M. Shakarji, Michael Hogan, Shirley M. Radack, Douglas Montgomery, L Johnson, R Rosenthal, R Mccabe, R Carpenter, Lisa Carnahan, M M. Gray
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Information Technology Measurement and Testing Activities at NIST

January 1, 2001
Author(s)
Michael D. Hogan, Lisa J. Carnahan, Robert J. Carpenter, David W. Flater, James E. Fowler, Simon P. Frechette, M M. Gray, L A. Johnson, R. McCabe, Douglas C. Montgomery, Shirley M. Radack, R Rosenthal, Craig M. Shakarji
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Effect of Nitrogen on Band Alignment in HfSiON Gate Dielectrics

November 22, 2005
Author(s)
Safak Sayan, Nhan V. Nguyen, James R. Ehrstein, James J. Chambers, Mark R. Visokay, Manuel Quevedo-Lopez, Luigi Colombo, T Yoder, Igor Levin, Daniel Fischer, M Paunescu, Ozgur Celik, Eric Garfunkel
… 0.05eV and the valence and conduction band offests by 1.20 +- 0.1 and 0.33 +- 0.05eV, respectively. …

Glass and Dimensional Metrology

April 1, 1997
Author(s)
Theodore D. Doiron
… glass, even good optical quality glass, will shrink up to 20 micrometers/meter over the first few years after its …

Hydrogen Storage with Aluminum Formate, ALF: Experimental, Computational, and Technoeconomic Studies

September 28, 2023
Author(s)
Hayden Evans, Taner N. Yildirim, Peng Peng, Yongqiang Cheng, Zeyu Deng, Qiang Zhang, Dinesh Mullangi, Dan Zhao, Pieremanuele Canepa, Hanna M. Breunig, Anthony K. Cheetham, Craig Brown
… of ALF is found between 120 K and 160 K and at 10 bar to 20 bar. The study illustrates H2 adsorption performance of … versus 350 bar). Given ALF's performance in the 10 bar to 20 bar regime under moderate cooling, it is particularly …

The Microwave Spectrum and Ground State Structure of H 2 O-HI

October 12, 2021
Author(s)
A McIntosh, T Walther, R R. Lucchese, J W. Bevan, R D. Suenram, A C. Legon
… MHz, C 0 =2175.9546(10) MHz, χ aa = -1479.399(20) MHz,(χ bb- χ cc ) = -17.37(2) MHz. Evidence will be … to a zero-point oscillation angle θ av = cos -1 ( 1/2 ) = 20.89(4) . The value of k α = 6.64(2) N m -1 evaluated from …

Improvements in Accelerometer Calibration at NIST Using Digital Vibrometry

April 29, 2017
Author(s)
Beverly F. Payne, Richard A. Allen, Colleen E. Hood
… Calibrations are performed at frequencies from 1Hz to 20 kHz with improved uncertainty and improved efficiency. The … the desired frequency range. For high frequencies (10 Hz – 20 kHz), a shaker with a ceramic mounting table which …
Displaying 576 - 600 of 2521
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