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Displaying 276 - 300 of 570

Discussion on the Full Entropy Assumption of the SP 800-90 Series

April 14, 2023
Author(s)
Darryl Buller, Aaron Kaufer, Allen Roginsky, Meltem Sonmez Turan
… The NIST SP 800-90 series [1][2][3] supports the generation of high-quality random bits for … of entropy per bit is at least 1 - ε, where ε is at most 2^-32}. This report provides a justification for the selection …

Polyoxocationic Antimony Oxide Cluster with Acidic Protons

June 17, 2022
Author(s)
Yuki Watanabe, Kim Hyeon-Deuk, Takafumi Yamamoto, Masayoshi Yabuuchi, Olesia M. Karakulina, Yasuto Noda, Takuya Kurihara, I-Ya Chang, Masanobu Higashi, Osamu Tomita, Cedric Tassel, Daichi Kato, Jingxin Xia, Tatsuhiko Goto, Craig Brown, Yuto Shimoyama, Naoki Ogiwara, Joke Hadermann, Artem M. Abakumov, Sayaka Uchida, Ryu Abe, Hiroshi Kageyama
… form a face-centered cubic structure with cationic Sb 32 O 44 clusters and two types of smaller anionic clusters in …

System Explanations: A Cautionary Tale

May 8, 2021
Author(s)
Ellen M. Voorhees
… or 'Poor' and one rating of 'Good' or 'Very Good'; and in 32 cases, the same explanation received all five possible …

Absolute and relative stability of an optical frequency reference based on spectral hole burning in Eu 3+ :Y 2 SiO 5

December 6, 2013
Author(s)
David R. Leibrandt, M Thorpe, Chin-Wen Chou, Tara M. Fortier, Scott A. Diddams, Till P. Rosenband
… reference based on spectral hole burning in Eu$ 3+ :Y 2 SiO 5 . The first frequency comparison, between a single … term stability of 1 × 10 -15 √τ that averages down to 2.5 +1.1 -0.5 × 10 -16 at τ = 540~s. Finally, spectral hole patterns in two different Eu 3+ :Y 2 SiO 5 crystals located in the same cryostat are compared …

Ultrafast Photoinduced Carrier Dynamics of Organic Semiconductors Measured by Time-Resolved Terahertz Spectroscopy

April 28, 2010
Author(s)
Okan Esenturk, Joseph S. Melinger, Paul A. Lane, Edwin J. Heilweil
… polymers poly(3-hexylthiophene) (P3HT) and poly(2,5-bis(3-tetradecylthiophen-2yl)thieno[3,2-b]thiophene (PBTTT) as model active layers of transistor … efficiency, poly(3-hexylthiophene), P3HT, poly(2, 5-bis(3-tetradecylthiophen-2yl)thieno[3, 2-b]thiophene, PBTTT, solar cell, thin film, Time-Resolved …

Frequency dependence of capacitance standards

September 1, 2003
Author(s)
Yicheng Wang
We measured the frequency dependence of a 10 pF transportable fused-silica capacitor from 50 Hz to 20 kHz. The results have a relative standard uncertainty of 0.32x10^(-6), 0.15x10^(-6), and 0.37x10(-6) at 100 Hz, 400 Hz, and 20 kHz, respectively. This

Frequency Comparison of 127 I 2 -Stabilized Nd: YAG Laser

April 1, 1999
Author(s)
F L. Hong, K Ishikawa, J Yoda, J Ye, L -. Ma, John L. Hall
… A first international comparison of I 2 -stabilized Nd: YAG lasers has been made between the … root Allan variance of the portable NRLM laser has reached 2 x 10 14 when the integration time is larger than 300 s. … five hyperfine components from a 6 to a 10 of the R(56) 32-0 line. The averaged frequency difference between the NRLM …

Standard Reference Material 2100: Fracture Toughness of Ceramics

June 1, 2001
Author(s)
George D. Quinn, K Xu, R J. Gettings, J A. Salem, J Swab
New Standard Reference Material (SRM) 2100 is the first reference material in the world for the property fracture toughness for any class material. The SRM is for ceramic fracture toughness and may be used with any ceramic fracture toughness test method
Displaying 276 - 300 of 570
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