U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21626 - 21650 of 73929

Nitro-Aromatic Explosive Sensing Using GaN Nanowire - Titania Nanocluster Hybrids

May 1, 2013
Author(s)
Albert Davydov, Geetha G. Aluri, Abhishek Motayed, Vladimir P. Oleshko, Kristine A. Bertness, Mulpuri V. Rao
A highly sensitive and selective detection of traces of nitro-aromatic explosive compounds by functionalizing gallium nitride (GaN) nanowires with anatase phase titania (titanium dioxide, TiO2) nanoclusters is demonstrated. The ultraviolet light photo

Random testing reveals excessive power in commercial laser pointers

May 1, 2013
Author(s)
Joshua A. Hadler, Edna L. Tobares, Marla L. Dowell
In random testing of 122 commercial laser pointers, we observed that 89.7 % of green pointers and 44.4 % of red pointers were not in compliance with the Code of Federal Regulations, producing laser power in excess of the Accessible Emission Limit at one or

Towards Demand Response Measurement and Verification Standards

May 1, 2013
Author(s)
David G. Holmberg, David Hardin, Ed Koch
The value and impact of demand response (DR) at grid-scale depends upon the widespread and active participation of a diverse customer base. The level of participation by customers is impacted by financial compensation and return-on-investment. The role of

Transmission EBSD in the Scanning Electron Microscope

May 1, 2013
Author(s)
Roy H. Geiss, Katherine P. Rice, Robert R. Keller
A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight

Interfacial Coupling in Multiferroic/Ferromagnet Heterostructures

April 30, 2013
Author(s)
M. Trassin, J. D. Clarkson, Samuel R. Bowden, j. Liu, J. T. Heron, R. J. Paull, Elke Arenholz, Daniel T. Pierce, John Unguris
We report local probe investigations of the magnetic interaction between BiFeO3 films and a ferromagnetic Co0.9Fe0.1 layer. Within the constraints of intralayer exchange coupling in the Co0.9Fe0.1, the multiferroic imprint in the ferromagnet results in a

Large Stroke Electrostatic Comb Drive Actuators Enabled by a Novel Flexure Mechanism

April 30, 2013
Author(s)
Mohammad Olfatnia, Siddharth Sood, Jason J. Gorman, Shorya Awtar
This paper reports in-plane electrostatic combdrive actuators with stroke as large as 245 μm that is achieved by employing a novel Clamped Paired Double Parallelogram (C-DPDP) flexure mechanism. The C-DP-DP flexure mechanism design offers high bearing

Topological Insulator Bi2Se3 Nanowire High Performance Field-Effect Transistors

April 30, 2013
Author(s)
Hao Zhu, Curt A. Richter, Erhai Zhao, John E. Bonevich, William A. Kimes, Hyuk-Jae Jang, Hui Yuan, Abbas Arab, Oleg A. Kirillov, James E. Maslar, D. E. Ioannou, Qiliang Li
Topological insulators are unique electronic materials with insulating interiors but robust metallic surfaces. Device applications exploiting their remarkable properties, such as surface conduction of helical Dirac electrons, have so far been hampered by

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013
Author(s)
Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen
Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement method

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013
Author(s)
Ravikiran Attota, Abraham Arceo, Bunday Benjamin
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely be

Limits in Modeling Power Grid Topology

April 29, 2013
Author(s)
Brian D. Cloteaux
Because of their importance to infrastructure, a number of studies have examined the structural properties of power grids and have proposed random topological models of them. We examine the ability to create generalized models of power grid structure by
Displaying 21626 - 21650 of 73929
Was this page helpful?