Classical over-the-barrier model for neutralization of highly charged ions above thin dielectric films

Published

June 3, 2013

Author(s)

Joshua M. Pomeroy, Russell E. Lake, C E. Sosolik

Abstract

We apply the classical over-the-barrier model (COB) to charge transfer between highly charged ions (HCIs)and targets consisting of thin dielectric films on metals. Distances for the onset of classically allowed above surface electron capture are obtained as a function of HCI charge state, film thickness, film permittivity and film/metal electron binding energies. The model describes the crossover between the previously existing COB for bulk metals and bulk dielectrics as the thickness of a dielectric film on a metal substrate increases through three distinct regimes. For ultrathin films with low permittivity and positive electron affinity, over-the-barrier charge transfer intiates from the metal electrons behind the film and critical distances are greater than those from bare metal targets. This result is consistent and compared with the recent observation of potential emission enhancement above thin C60 films on Au(111) with increasing film thickness [Phys. Rev. A 84, 042901 (2011)].

Citation

Physical Review A

Volume

87

Pub Type

Journals

Keywords

Classical over the barrier, Highly Charged ions

Citation

Pomeroy, J. , Lake, R. and Sosolik, C. (2013), Classical over-the-barrier model for neutralization of highly charged ions above thin dielectric films, Physical Review A (Accessed December 15, 2024)