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Displaying 32176 - 32200 of 74089

Long distance decoy state quantum key distribution in optical fiber

January 5, 2007
Author(s)
Danna Rosenberg, Jim A. Harrington, Patrick R. Rice, Philip A. Hiskett, Charles G. Peterson, Richard J. Hughes, Jane E. Nordholt, Adriana Lita, Sae Woo Nam
The theoretical existence of photon-number-splitting attacks creates a security loophole for most quantum key distribution (QKD) demonstrations that use a highly attenuated laser source. Using ultralow-noise, high-efficiency transition-edge sensor

On the Vickers Indentation Fracture Toughness Test

January 4, 2007
Author(s)
George D. Quinn, Richard Bradt
The Vickers indentation fracture toughness test or VIF is addressed by considering its origins and the numerous equations that have been applied along with the technique to estimate the fracture resistance, or the KIc of ceramics. Initiation and

Web Application Scanners: Definitions and Functions

January 3, 2007
Author(s)
Elizabeth N. Fong, Vadim Okun
There are many commercial software security assurance tools that claim to detect and prevent vulnerabilities in application software. However, a closer look at the tools often leaves one wondering which tools find what flaws? This paper identifies a

Manufacture and Metrology of 300 mm Silicon Wafers with Ultra-Low Thickness Variations

January 2, 2007
Author(s)
Ulf Griesmann, Quandou (. Wang, Marc Tricard, Paul Dumas, Christopher Hill
With the evolution of exposure tools for optical lithography towards larger numerical apertures, the semiconductor industry expects continued demand for improved wafer flatness at the exposure site. The Allowable site flatness for 300 mm wafers is expected

Standard Reference Materials Catalog - January 2007

January 2, 2007
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

3D Image Correction of Tilted Sample Through Coordinate Transformation

January 1, 2007
Author(s)
Wei Chu, Joseph Fu, Ronald G. Dixson, Theodore V. Vorburger
In scanned probe measurements of micrometer- or nanometer-scale lines, it is nearly impossible to maintain the sample in a perfectly level position, and even a small amount of tilt angle can contribute to the accuracy of the result of measurand such as
Displaying 32176 - 32200 of 74089