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Displaying 18251 - 18275 of 74089

Accurate Fast Capacitance Measurements for Reliable Device Characterization

July 1, 2014
Author(s)
Pragya R. Shrestha, Kin P. Cheung, Jason P. Campbell, Jason T. Ryan, Helmut Baumgart
As device dimensions continue to scale, transient phenomena are becoming increasingly more important to understand for both performance and reliability considerations. Recently, fast capacitances versus voltage (CV) measurements have been gaining attention

Angle-resolved diffuse reflectance and transmittance

July 1, 2014
Author(s)
Thomas A. Germer, J C. Stover, Sven Schroeder
This chapter will cover the topic of bidirectional reflectance distribution function [BRDF] measurements. These measurements, like the diffuse reflectance and transmittance measurements described in the previous chapter, cover the gamut from highly

Determination of the Planck constant at the National Institute of Standards and Technology

July 1, 2014
Author(s)
Stephan Schlamminger, Darine El Haddad, Frank C. Seifert, Leon S. Chao, David B. Newell, Ruimin Liu, Richard L. Steiner, Jon R. Pratt
In 2013, a new measurement of the Planck constant h was performed using a watt balance at the National Institute of Standards and Technology (NIST). The value is h=6.626 069 79(30) x 10^{-34} J s. The relative standard uncertainty of this determination is

Dispersive Methods

July 1, 2014
Author(s)
Arnold A. Gaertner, Howard Yoon, Thomas Germer
Chapter 3 will discuss dispersive means of obtaining spectral resolution in spectrophotometry. These methods are used to spatially disperse or separate the various wavelengths of optical electromagnetic radiation to enable analysis of material properties

EXPERIMENTAL STUDY OF RC ASSEMBLIES UNDER A COLUMN REMOVAL SCENARIO

July 1, 2014
Author(s)
Hai S. Lew, Yihai Bao, Santiago Pujol, Mete Sozen
This paper presents an experimental study of two full-scale reinforced concrete (R/C) beam-column assemblies under a column removal scenario. The assemblies represent portions of the exterior moment-resisting frames of two ten-story R/C frame buildings

Final report of the key comparison CCQM-K98: Pb isotope amount ratios in bronze

July 1, 2014
Author(s)
Jochen Vogl, Yong-Hyeon Yim, Kyoung-Seok Lee, Heidi Goenaga-Infante, Dmitriy Malinowskiy, Tongxiang Ren, Jun Wang, Robert D. Vocke Jr., Karen E. Murphy, Naoko Nonose, Olaf Rienitz, Janine Noordmann, Teemu Naeykki, Timo Sara-Aho, Bet?l Ari, Oktay Cankur
Isotope amount ratios are proving useful in an ever increasing array of applications that range from studies unravelling transport processes, to pinpointing the provenance of specific samples as well as trace element quantification by using isotope

Influence of morphology on current-voltage behavior of GaN nanowires

July 1, 2014
Author(s)
Paul T. Blanchard, Kristine A. Bertness, Matthew D. Brubaker, Todd E. Harvey, Aric W. Sanders, Norman A. Sanford
We demonstrate the effect that the different morphologies of MBE-grown GaN nanowires (NWs) can have upon current-voltage (I-V) behavior. Two main aspects of NW morphology were investigated. The first aspect was the NW diameter, dNW. For single-crystal Si

Microresonator frequency comb optical clock

July 1, 2014
Author(s)
Scott B. Papp, Katja M. Beha, Pascal P. Del'Haye, Franklyn J. Quinlan, Hansuek Lee, Kerry J. Vahala, Scott A. Diddams
Optical frequency combs enable measurement precision at the 20th digit, and measurement accuracy entirely commensurate with their reference oscillator. A new direction in experiments is the creation of ultracompact frequency combs by way of nonlinear

New Developments in the NIST Infrared Optical Properties of Materials Program

July 1, 2014
Author(s)
Leonard M. Hanssen, Sergey Mekhontsev, Jinan Zeng, John H. Burnett
The Infrared Optical Properties of Materials program in the Sensor Science Division at the National Institute of Standards and Technology (NIST) continues to upgrade its capabilities to provide comprehensive coverage of measurable infrared optical

Preface and Introduction

July 1, 2014
Author(s)
Thomas A. Germer, Joanne C. Zwinkels, Benjamin K. Tsai
This constitutes the front matter (preface and introductory chapter) to the book, "Spectrophotometry: Accurate Measurements of the Optical Properties of Materials," The introduction presents a short history of spectrophotometry. A very brief description of

Scanning Ion Microscopy with Low Energy Lithium Ions

July 1, 2014
Author(s)
Kevin A. Twedt, Lei Chen, Jabez J. McClelland
Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers and beam energies from 500 eV to 5 keV. These beam energies are much lower than the typical
Displaying 18251 - 18275 of 74089