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This document specifies specifies the components of an industrial data standard; the roles played by these components; the software technologies used to represent the components; and the way in which components are shared or harmonized between different
Janet M. Cassard, Richard A. Allen, Craig D. McGray, Jon C. Geist
This paper presents the results of a microelectromechanical systems (MEMS) Young s modulus and step height round robin experiment, completed in April 2009, which compares Young s modulus and step height measurement results at a number of laboratories. The
Aaron M. Forster, Diane Mauchant, Elizabeth Wailes, Amanda L. Forster, Michael A. Riley, Kirk D. Rice
Polymer foams serve an important role in the assessment and certification of stab resistant body armor for both US and UK standards. A composite of neoprene and polyethylene foam is used behind the armor during testing. The foam mimics stab dynamics by
We first discuss why international standards are important for nanomanufacturing and business models. The scopes and structures of the International Electrotechnical Commission Technical Committee 113 (IEC TC 113) on nano-electrotechnologies and the
The National Conference of Standards Laboratories International (NCSLI) 164 Education Liaison and Outreach Committee has coordinated the development of a Metrology Career Multimedia DVD, titled "Find a Cool Career in Metrology." The DVD is designed for use
Discussed are the efforts undertaken at the National Institute of Standards and Technology to create a new set of high-resistance standards (specifically the 10 MΩ to 100 MΩ range) using newer more stable film-type resistors. The history of film-type
Tina G. Butcher, Linda D. Crown, Steven E. Cook, Lisa Warfield
This is the Annual Meeting agenda for the standing committees of the National Conference on Weights and Measures (NCWM). This meeting is scheduled to take place July 11-15, 2010, in St. Paul, MN.
Sudarsan Rachuri, Jae H. Lee, Anantha Narayanan Narayanan, Prabir Sarkar, Kevin W. Lyons, Ram D. Sriram, Sharon J. Kemmerer
This report summarizes the presentations, discussions and recommendations of NIST Workshop on Sustainable Manufacturing: Metrics, Standards, and Infrastructure held at NIST, USA, on October 13th through October 15th, 2009. The primary objective of this
Betty A. Sandoval, Leticia S. Pibida, Gordon Gillerman, Michael P. Unterweger
NIST Handbook 150-23, NVLAP Homeland Security Applications: Radiation Detection Instruments, presents the technical requirements and guidance for the accreditation of laboratories that test radiation detection instruments used in homeland security
Use of metric labeling on United States consumer products has a long history. Currently, the Fair Packaging and Labeling Act (FPLA) requires dual unit labeling, while products regulated by states under the Uniform Packaging and Labeling Regulation (UPLR)
ASTM E 2187 has become the internationally referenced standard for designing and specifying less fire-prone cigarettes. In this test method, a lit cigarette is laid on multiple layers of filter paper, and the observer identifies whether the cigarette burns
NIST Handbook 150-18 program-specific handbook supplements NIST Handbook 150 by providing additional requirements, guidance, and interpretive information applicable specifically to the fastener and metals laboratory accreditation program (LAP).
Objective: To review the history, theory and current applications of Weibull analysis sufficient to make informed decisions regarding practical use of the analysis in dental material strength testing. Data: References are made to examples in the engeering
This report is an introduction to standardization and the U.S. standards system for readers that are not familiar with this topic. It highlights some of the more important aspects of this field; furnishes the reader with both historical and current
David R. Novotny, Jeffrey R. Guerrieri, Daniel G. Kuester
The potential of electromagnetic (EM) interference between multi-channel, FCC Part 15 UHF (902-928 MHz) ISM [1] emitters and devices that have passed immunity requirements under international standards [2] is examined. At close ranges, the fields from a
NIST Handbook 150-25 presents technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Biometrics program. It is intended for information and use by accredited
Richard D. Peacock, Jason D. Averill, Erica D. Kuligowski, Richard W. Bukowski
Historically, building egress systems have evolved in response to specific large loss incidents. Currently, systems are designed around a concept of providing stair capacity for the largest occupant load floor in the building with little or no
In support of the U.S. Department Energy s Energy Star program for solid state lighting, a series of standards for solid state lighting products have been developed in the USA. The standards published related to measurement and color include ANSI-NEMA
Edwin R. Williams, Darine El Haddad, V Generalova, Pierre Gournay, C. Hauch, F. Villar, Richard L. Steiner, Ruimin Liu
This paper describes a new method to damp out balance pan oscillations even when the balance is operated in vacuum. The key is to tune the wavelength of the damping liquid, which resides in a sealed container attached above the pan, to the natural
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values
Dean G. Jarrett, Randolph E. Elmquist, Nien F. Zhang, Alejandra Tonina, M Porfiri, Janice Fernandes, H Schechter, Daniel Izquierdo, C Faverio, Daniel Slomovitz, Dave Inglis, Kai Wendler, Felipe Hernandez-Marquez, B Rodriguez
A set of regional comparisons of dc resistance standards at the nominal values of 1 {Ω}, 1 M {Ω}, and 1 G {Ω} has recently been completed in the Sistema Interamericano de Metrogia (SIM) region. The motivation, design, standards, and results of these
Randolph E. Elmquist, Dean G. Jarrett, Nien F. Zhang
2006 - 2007 Resistance standards comparison between SIM Laboratories Pilot Laboratory: National Institute of Standards and Technology, Gaithersburg, MD, USA. Revised March 2008.
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains