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SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT

Published

Author(s)

Randolph E. Elmquist, Dean G. Jarrett, Nien F. Zhang

Abstract

2006 - 2007 Resistance standards comparison between SIM Laboratories Pilot Laboratory: National Institute of Standards and Technology, Gaithersburg, MD, USA. Revised March 2008.
Citation
BIPM Key Comparison Database

Keywords

Resistance measurement, Comparison, Degree of equivalence, Measurement standards, Uncertainty

Citation

Elmquist, R. , Jarrett, D. and Zhang, N. (2009), SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT, BIPM Key Comparison Database, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33025 (Accessed June 5, 2023)
Created January 1, 2009, Updated February 19, 2017