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PUBLICATIONS

SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT

Published

Author(s)

Randolph E. Elmquist, Dean G. Jarrett, Nien F. Zhang

Abstract

2006 - 2007 Resistance standards comparison between SIM Laboratories Pilot Laboratory: National Institute of Standards and Technology, Gaithersburg, MD, USA. Revised March 2008.
Citation
BIPM Key Comparison Database
Pub Type
Others

Download Paper

Local Download

Keywords

Resistance measurement, Comparison, Degree of equivalence, Measurement standards, Uncertainty
Documentary standards

Citation

Elmquist, R. , Jarrett, D. and Zhang, N. (2009), SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT, BIPM Key Comparison Database, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33025 (Accessed October 14, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 2009, Updated February 19, 2017
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