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This report provides general recommendations for collecting, curating, and re-using manufacturing data from both additive and subtractive processes. The intended audience includes researchers, technical-assessment personnel, and end-users who would like to
Adam C. Weis, Nathan E. Flowers-Jacobs, Stuart Berkowitz, Horst Rogalla, Samuel P. Benz
Microwave-driven Josephson junction arrays are the basis for dc and ac voltage standards, whose accuracy derives from quantized voltage pulses. These pulses are also used to synthesize voltage- noise reference signals that are used in noise thermometry
Standards to represent and manage manufacturing data are proliferating as industry rapidly digitizes. The existing global standards development paradigm for manufacturing data needs to shift to digital tools and workflows that produce machine-readable
Carl Simon, Josh Hunsberger, Claudia Zylberberg, Preveen Ramamoorthy, Thomas Tubon, Crystal Ruff, Ram Bedi, Kurt Gielen, Lynn Fisher, Jed Johnson, Priya Barankiak, Behzad Mahdavi, Michael Hadjisavas, Shannon Eaker, Cameron Miller
Regenerative Medicine Manufacturing Society (RMMS), is the first and only professional society dedicated specifically towards advancing manufacturing solutions for the field of regenerative medicine. RMMS' vision is to provide greater patient access to
David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM
Due to the rapidly growing interest in energy harvesting from indoor ambient lighting for the powering of internet-of-things devices, accurate methods for proper measurements of the current vs voltage characteristics of light-harvesting solar photovoltaic
Carl Simon, Becky Robinson-Zeigler, Michael Yaszemski, Jayesh Doshi, Michael Francis, Sherif Soliman, Lexi Garcia
As the tissue engineering and regenerative medicine (TERM) industry transitions from small-scale development of prototypes for research and design purposes to large-scale production for the clinic there is a need to ensure that products are properly
Shamith Payagala, Alireza Panna, Albert Rigosi, Dean G. Jarrett
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard resistors. Despite the high quality of these methods, there still exist inherent limitations to the
Bradley W. Moore, Beverly A. Trapnell, James F. Fox, Carolyn French
NIST Handbook 150-17 presents the technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Cryptographic and Security Testing program. It is intended for information and
NIST Special Publication (SP) 800-140B is to be used in conjunction with ISO/IEC 19790 Annex B and ISO/IEC 24759 6.14. The special publication modifies only those requirements identified in this document. SP 800-140B also specifies the content of the
Ashley B. Green, David M. Bunk, Nien F. Zhang, Wendell Alejo
This Standard Reference Material (SRM) is intended primarily for use in the preparation of calibration solutions for a candidate reference measurement procedure for human serum albumin (HSA) in human urine. This candidate reference measurement procedure is
The orthogonal superposition (OSP) technique is advantageous for measuring structural dynamics in complex fluids subjected to a primary shear flow. This technique superimposes a small amplitude oscillation orthogonal to a primary shear flow to measure the
New smart grid architectures, devices, systems, and applications require extensive data exchange, necessitating well-defined interfaces to transfer and translate this data across the grid. Clarifying the protocols and data performance requirements across
Cuong T. Nguyen, Avi M. Gopstein, Danielle S. Byrnett, Kerry Worthington, Christopher Villarreal
From September to November 2018, the National Institute of Standards and Technology (NIST) partnered with the National Association of Regulatory Utility Commissioners (NARUC) to hold a series of roundtable meetings to support the revision of its Framework
Max K. Ferguson, Yung-Tsun Lee, Anantha Narayanan, Kincho H. Law
Convolutional neural networks are becoming a popular tool for image processing in the engineering and manufacturing sectors. However, managing the storage and distribution of trained models is still a difficult task, partially due to the lack of
Accurate enthalpies of formation of hydrofluoric acid in the gas and liquid states as well as in aqueous solutions are critical for reduction and interpretation of combustion calorimetry data for fluorinated compounds. Analysis of current recommendations
Johnny Jimenez, Maria Ugalde, John H. Lehman, Igor Vayshenker
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Laboratorio de Metrologia, Instituto Costarricense de Electricidad (LAMETRO-ICE, COSTA RICA) for optical fiber-based
Standard test methods and academic competitions share much in common. We detail how we use standard test methods to promote education, research, development and dissemination among the academic community. Since 2014, we have used competitions and open
For the determination of the shear strength, strain and modulus of reinforced composites, nearly a dozen measurement techniques exist, several of which are supported by ASTM or ISO standards. One reason for so many options is the difficulty in obtaining a
Deborah Jacobs, Mauro Masili, Fernanda O. Duarte, Liliane Ventura, Christopher C. White
In our previous investigations on sunglasses standards, limits and requirements have been suggested for ocular safety. In this paper we evaluate the degradation of the lenses (category and ultraviolet protection) as sunglasses are exposed to solar
Marcus H. Mendenhall, Lawrence T. Hudson, Csilla I. Szabo-Foster, Albert Henins, James P. Cline
Abstract We present newly measured spectra of the X-ray emission of a molybdenum metal anode subject to electron bombardment, using a very high dispersion silicon double-crystal spectrometer. The measurement includes the dipole-allowed KL, KM, and KN
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies