March 18, 2016
Author(s)
Ann C. Chiaramonti Debay, Baptiste Gault, Michael Ashton, Susan B. Sinnott, Michael P. Moody, David W. Saxey, D. K. Schreiber
The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy technique with near-atomic spatial resolution. Increasingly