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Metrology

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Displaying 101 - 125 of 5207

Application of Electrical Standards to Torque Realization: A Device to Measure up to 1Nm

February 14, 2024
Author(s)
Zane Comden, Stephan Schlamminger, Frank Seifert, David B. Newell, Leon Chao
This paper describes the next generation prototype of the Electronic NIST Torque Realizer (ENTR) project. The first prototype version (ENTR-v1) has been able to realize low-range torques (on the order of 1×10-3 Nm) to uncertainties of less than 1000 parts

Multi-kilowatt cw laser power measurement comparison between NMI standards

February 14, 2024
Author(s)
Kyle Rogers, Paul A. Williams, John H. Lehman, Marco Lopez, Marcel Pastuschek, Holger Lecher, Stefan Kueck
We present here the first comparison between National Metrology Institutes (NMIs) of high accuracy continuous wave (cw) optical power measurements in the kilowatt regime. The National Institute of Standards and Technology (NIST) performed measurements with

Measurement of 100 nm Monodisperse Particles by Four Accurate Methods: Uncertainty and Traceability

February 12, 2024
Author(s)
George Mulholland, Kaleb Duelge, Vincent A. Hackley, Natalia Farkas, John A. Kramar, Keiji Takahata, Michael Zachariah, Hiromu Sakurai, Kensei Ehara
Accurate measurements of particle diameter are necessary for quantitative characterization of key aerosol properties including the Cunningham slip correction, charging probability, the diffusion coefficient, the coagulation coefficient, and optical

Ultra-Low Phase Noise Frequency Division with Array of Direct Digital Synthesizers

December 25, 2023
Author(s)
Marco Pomponio, Archita Hati, Craig Nelson
In this article, we present a four-channel direct digital synthesis (DDS) design that operates with a common clock ranging from 500 MHz to 24 GHz and generates output frequencies up to 1.75 GHz. A key feature of this board is its custom field-programmable

Comparison of Direct and Indirect Measures of Transport Efficiency in Single Particle ICP-MS

December 16, 2023
Author(s)
Karen Murphy, Antonio Montoro Bustos, Lee L. Yu, Monique Johnson, Michael R. Winchester
Accurate calibration of the fraction of introduced sample that is transported to the plasma, termed "transport efficiency" (TE), is required for spICP-MS measurement of particle number concentration (PNC) and for measurement of particle size (diameter, PS)

NIST Office of Weights and Measures (OWM) Recognition Program Handbook, 7th Edition

December 11, 2023
Author(s)
Micheal Hicks, Georgia L. Harris, Katrice Lippa, Isabel Chavez Baucom, Elizabeth Koncki
Handbook 143 provides the National Institute of Standards and Technology (NIST) Office of Weights and Measures (OWM) performance standards and formalized procedures for the voluntary recognition of State legal metrology laboratories. This 2023 edition

Robotic Antenna Measurements

December 11, 2023
Author(s)
Josh Gordon
Robots excel at manipulating objects with 6 degree of freedom movement. A combination of well-defined kinematics, optimized control loops, and robust mechanical architecture make robots a versatile and capable platform for a range of applications where

INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMSTM 2023 EDITION METROLOGY

December 8, 2023
Author(s)
Elisabeth Mansfield, Bryan Barnes, R Joseph Kline, Andras E. Vladar, Yaw S. Obeng, Albert Davydov
The Metrology Chapter identifies emerging measurement challenges from devices, systems, and integration of new materials in the semiconductor industry and describes research and development pathways for meeting them. This includes but not limited to

Bipartite time-energy uncertainty relation for quantum metrology with noise

December 5, 2023
Author(s)
Philippe Faist, Mischa Woods, Victor Albert, Joseph Renes, Jens Eisert, John Preskill
Noise in quantum metrology reduces the sensitivity to which one can determine an unknown parameter in the evolution of a quantum state, such as time. Here, we consider a system prepared in a pure state that evolves according to a given Hamiltonian. We

NIST efforts in extreme-ultraviolet metrology

November 21, 2023
Author(s)
Charles S. Tarrio, Steven Grantham, Rob Vest, Thomas A. Germer, Bryan Barnes, Stephanie Moffitt, Brian Simonds, Matthew Spidell
For several decades, the National Institute of Standards and Technology (NIST) has actively supported metrology programs for extreme ultraviolet (EUV) lithography. We will describe our existing programs in optics lifetime, reflectometry, and radiometry

Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

November 15, 2023
Author(s)
Rob Jones, Jerome Cheron, Bryan Bosworth, Ben Jamroz, Dylan Williams, Miguel Urteaga, Ari Feldman, Peter Aaen
In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization from 220 GHz to 325 GHz on both a microstrip and an inverted coplanar waveguide with a via stitched ground

Measuring the frequency of a pendulum

November 13, 2023
Author(s)
Jon R. Pratt, Stephan Schlamminger, Charles Condos, Jack Manley, Dalziel Wilson
We previously reported the use of a chip-scale torsion pendulum as a clock gravimeter, exploiting the parametric coupling of its frequency to the local acceleration of gravity and demonstrating micro-g resolution with a silicon nitride prototype. Here, we

EDFAS FA TECHNOLOGY ROADMAP DIE-LEVEL ROADMAP COUNCIL (DLRC) POST-ISOLATION DOMAIN TECHNICAL REPORT - JAN 2023

November 10, 2023
Author(s)
Vinod Narang, Zhang Chuan, David Su, Phil Kaszuba, Steven Herschbein, Alan Street, Eckhard Langer, Martin von Haartman, Yu Zhu, Baohua Niu, Erwin Hendarto, Bryan Tracy, Jochonia Nxumalo, Rik Otte, Keana C. K. Scott
Semiconductor technologies are advancing at a rapid pace, with ongoing developments in logic and memory scaling, the introduction of new materials and transistor architectures, and the integration of advanced packaging heterogeneous technologies such as

NIST SI Units Card Deck

November 1, 2023
Author(s)
Dinelka Jagoda, Elizabeth Benham
Welcome to the SI Units Card Deck! This interactive educational activity offers a fun way for students to enhance their understanding of the International System of Units (SI), including the Defining Constants, Base Units, Derived Units with Special Names

The NIST Silicon Lattice Comparator Upgrade

October 3, 2023
Author(s)
Marcus Mendenhall, James Cline, Csilla Szabo-Foster, Albert Henins
The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between specimens of high-quality float-zone silicon to delta-d/d approximately 6e-9. It has recently