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Daniel T. Pierce, Robert Celotta, Michael H. Kelley, John Unguris
The measurement of the spin polarization of photoelectrons emitted from a magnetic material is discussed. An important consideration is the acceptance phase space of the spin analyzer relative to the phase space of the photoemitted electrons to be measured
A variety of ac and dc resistors were examined for frequency dependence from dc to 400 Hz. It is concluded that several choices are available for use as standards in resistance thermometry.
We describe a torsion-oscillator viscometer whose low frequency ( 0.5 Hz) and very low shear rate (0.05 s-1) are required for measurements of shear sensitive fluids such as microemulsions, polymer melts and solutions gels, and liquid mixtures near critical
A new, compact (approximately fist sized), efficient electron-spin analyzer is described. It is based on low-energy (150 eV) diffuse scattering from a high-Z target, for example, an evaporated polycrystalline Au film opaque to the incident electron beam
C Feigerle, Daniel T. Pierce, A Seiler, Robert Celotta
Measurements of intensity and width of the energy distribution for photoemission from negative electron affinity GaAs have been made as a function of surface preparation and temperature. Energy distributions as narrow as 31 meV (full width at half-maximum)
This note describes a safe, effective tool for removing copper gaskets from ultrahigh vacuum flanges. Use of the tool practically reduces to zero the chance of damaging the flange sealing surface, because all motion of the tool is away from the flange face
Daniel T. Pierce, S Girvin, John Unguris, Robert Celotta
The principle of spin analysis by means of measurement of the spin dependent absorption of a polarized electron beam is presented. The spin dependent signal is enhanced relative to the spin averaged signal at an energy near which the secondary yield is
Robert Celotta, Daniel T. Pierce, H Siegmann, John Unguris
The exchange interaction and the spin-orbit interaction are observed to cause a spin dependence of the absorption of a polarized electron beam in the amorphous ferromagnet Ni 40Fe 40B 20 and a W(100) single crystal respectively. The enhancement of the spin
X-ray spectra measured in the variable-pressure scanning electron microscope (VPSEM, chamber pressure 1 to 2500 Pa) suffer significantly degraded spatial resolution compared to high-vacuum SEM (operating pressure 0.1 mass fraction), minor (0.01≤ C ≤ 0.1)
Metrology is often used in designing and controlling manufacturing processes. A product sample is processed, some relevant property is measured, and the process adjusted to bring the next processed sample closer to its specification. This feedback loop can