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NIST Capacitance Measurement Assurance Program (MAP)

Published

Author(s)

Yui-May Chang
Proceedings Title
Proc., Measurement Science Conference
Conference Dates
January 21-22, 1993
Conference Location
Anaheim, CA

Citation

Chang, Y. (1993), NIST Capacitance Measurement Assurance Program (MAP), Proc., Measurement Science Conference, Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18794 (Accessed December 6, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 1, 1993, Updated February 19, 2017