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Manufacturing

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Displaying 801 - 825 of 2183

ISO TC 184/SC 4 product and manufacturing information (PMI) EXPRESS models

December 1, 2014
Author(s)
Thomas R. Thurman
This document provides product and manufacturing information (PMI) EXPRESS models to be used in ISO 10303-242 edition 2. The models include representations for the following PMI symbology: thread symbols, surface texture symbols, edge condition symbols

A Cross-Domain Survey of Metrics for Modeling and Evaluating Collisions

November 28, 2014
Author(s)
Jeremy A. Marvel, Roger V. Bostelman
This paper provides a brief assessment of the metrics for measuring probability, degree, and severity of collisions as applied to autonomous and intelligent systems. Though not exhaustive, this survey evaluates the state-of-the-art of collision metrics

Toward Smart Manufacturing Using Decision Guidance Analytics

November 1, 2014
Author(s)
Alexander Brodsky, Mohan Krishnamoorthy, Daniel A. Menasce, Guodong Shao, Sudarsan Rachuri
This paper is focused on decision analytics for smart manufacturing. We consider temporal manufacturing processes with stochastic throughput and inventories. We demonstrate the use of the recently proposed concept of the decision guidance analytics

Feasibility of Integrating OAGIS and BPMN

October 22, 2014
Author(s)
Denis Gagne, Conrad Bock
Engineering and enterprise processes overlap in their concerns, for example, coordinating product design and customer relations. Integration of these processes provides more efficient communication and higher quality results than leaving them separated

Streamlining the Additive Manufacturing Digital Spectrum: A Systems Approach

October 18, 2014
Author(s)
Duck B. Kim, Paul Witherell, Robert R. Lipman, Shaw C. Feng
Additive Manufacturing (AM) provides great potential for industrial manufacturers who require low volume and functional, highly complex end use products. Given AM's potential, numerous research efforts are underway to reduce the time and improve the

A Cybersecurity Testbed for Industrial Control Systems

October 9, 2014
Author(s)
Richard Candell, Keith A. Stouffer, Dhananjay Anand
The National Institute of Standards and Technology (NIST) is developing a cybersecurity testbed for industrial control systems (ICS). The goal of this testbed is to measure the performance of an ICS when instrumented with cybersecurity protections in

An improved L1 based algorithm for standardized planar datum establishment

October 1, 2014
Author(s)
Craig M. Shakarji, Vijay Srinivasan
This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a convex

Toward Manufacturing System Composability Analysis: A Use Case Scenario

September 20, 2014
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Nenad Ivezic, Yunsu Lee
One of the characteristics of a smart manufacturing system is the ability to quickly adapt to new and changing requirements. This implies that software and hardware components of the manufacturing system need to be easily composed and recomposed. In

Obstacle Detection and Avoidance from an Automated Guided Vehicle

September 18, 2014
Author(s)
Roger V. Bostelman, William P. Shackleford, Geraldine S. Cheok
Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then stops

PMML in Manufacturing Applications

September 12, 2014
Author(s)
Yung-Tsun T. Lee, Juyeon Lee
In manufacturing, an enormous amount of data, both real and simulation data, is being continuously generated. The appropriate information, if extracted from big data, could provide insights on increasing sustainability, productivity, flexibility, and

Selective Area Growth of Ga- and N-polar GaN Nanowire Arrays on Non-Polar Si (111) Substrates

September 7, 2014
Author(s)
Matthew D. Brubaker, Shannon M. Duff, Todd E. Harvey, Paul T. Blanchard, Alexana Roshko, Aric W. Sanders, Norman A. Sanford
This study presents a technique for obtaining Ga- and N-polar Gallium Nitride nanowire (GaN NW) arrays on non-polar Si (111) substrates by use of polarity-controlled AlN/GaN buffer layers. AlN films are demonstrated to adopt Al-/N-polarity for N-/Al-rich
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