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Kent D. Irwin, Michael D. Niemack, Joern Beyer, Hsiao-Mei Cho, William B. Doriese, Gene C. Hilton, Carl D. Reintsema, Daniel R. Schmidt, Joel N. Ullom, Leila R. Vale
Multiplexed superconducting quantum interference device (SQUID) amplifiers have recently enabled the deployment of kilopixel arrays of superconducting transition-edge sensor (TES) detectors on a variety of receivers for astrophysics. Existing multiplexing
Carl D. Reintsema, Gene C. Hilton, Kent D. Irwin, Joseph S. Adams, Robert Baker, Simon R. Bandler, William B. Doriese, Enectali Figueroa-Feliciano, Richard L. Kelly, Caroline A. Kilbourne, F. S. Porter, Jeff Krinsky, Patrick Wikus
A decade has elapsed since the design, development and realization of a SQUID-based time-division multiplexer at NIST. During this time the system has been used extensively for low-temperature-detector-array measurements. Concurrently, there have been
Jifeng Qu, Samuel Benz, Horst Rogalla, David R. White
The variance of temperature measurements made with the NIST Johnson noise thermometer has been reduced by use of improved cross-correlation electronics and a unique method for measuring and reducing nonlinearities. The spectral response of the voltage
Charles J. Burroughs, Alain Rufenacht, Paul D. Dresselhaus, Samuel P. Benz, Mike Elsbury
The output voltage of Programmable Josephson Voltage Standard (PJVS) circuits has reached the 10 V benchmark, which was set over twenty years ago by conventional dc Josephson Voltage Standard (JVS) systems. The non-hysteretic Josephson junctions in these
Douglas A. Bennett, Robert D. Horansky, Joel N. Ullom
Complex impedance is an important and widely used technique for characterizing microbolometers and microcalorimeters. Often, complex impedance data from actual devices does not fit the simple one-body model of a TES microcalorimeter. In this paper we will
Information theory places constraints on multiplexing large low-temperature detector arrays. We discuss these constraints, and review the state of the art of multiplexed low-temperature detector arrays. The number of detectors read out by each output
Franz Mueller, Ralf Behr, R. Wendisch, Johannes Kohlmann, Paul Dresselhaus, Samuel Benz
Double-stacked Nb junctions with NbxSi1-x barriers were inserted into previously successfully tested 1 V and 10 V designs for Programmable Josephson voltage standards (PJVSs) with bias frequency near 70 GHz. Despite non-optimum targeting of the junction
Josephson junctions that use co-sputtered amorphous Nb-Si barriers can be made with a wide variety of electrical properties depending on both the thickness of the barrier and its ratio of Nb to Si. Critical current density (Jc), specific capacitance (Cs)
David I. Olaya, Paul D. Dresselhaus, Samuel P. Benz
Digital superconducting electronics (SCE), which allows for very low power consumption and fast switching speeds, are a promising technology to deliver ultra-high performance computation. Currently, the preferred technology for junctions in SCE consists of
Mike Elsbury, Paul D. Dresselhaus, Samuel P. Benz, Zoya Popovic
This paper presents a monolithically-integrated, broadband, lumped-element, symmetrical-hybrid power divider centered at 20 GHz which was designed and fabricated to uniformly distribute power to arrays of Josephson junctions for superconducting voltage
Franz Mueller, Ralf Behr, T. Weimann, Luis Palafox, David I. Olaya, Paul Dresselhaus, Samuel Benz
Programmable Josephson voltage standards (PJVSs) in combination with fast switchable DC current sources have opened up new applications in the field of low frequency AC metrology. The growing interest in output voltages of up to 10 V initiated efforts by
Mike Elsbury, Charles J. Burroughs, Paul Dresselhaus, Zoya Popovic, Samuel Benz
Improvements to the packaging of Josephson Volt- age Standard (JVS) circuits have increased operating margins, reliability, and longevity of these systems. By using the "flip- chip-on-flex" technique, reliable chip and cryoprobe mounting have been
We have extended the application of quantum-based electrical standards from single frequency calibrations to multi-tone tests that can be used to characterize the nonlinear behavior of electronic components and circuits. Specifically, we have used a