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K Seal, A K. Sarychev, H Noh, D A. Genov, A Yamilov, Vladimir Shalaev, Z C. Ying, H Cao
Spatial intensity correlation functions are obtained from near-field scanning optical microscope measurements of semicontinuous metal-dielectric films. The concentration of metal particles on a dielectric surface is varied over a wide range to control the
X-ray fluorescence spectroscopy is a widely used method for determining the electronic configuration and local structure of dilute species with high sensitivity. In the dilute limit, and for thin films, the x-ray fluorescence signal is directly
The near-edge x-ray absorption fine structure (NEXAFS) spectra of poly(amino acids) at the carbon, nitrogen and oxygen k-edges are investigated in this study. The poly(amino acid) NEXAFS spectra at the k-edges closely resemble the spectra of the
T M. Schuler, D L. Ederer, S Itza-Ortiz, G T. Woods, T A. Callcott, Joseph Woicik
Using site-specific soft x-ray emission and absoroption spectroscopy in conjunction with site-specific x-ray photoelectron spectroscopy, we measure the magnitude of the insulating band gap of NiO to be approximately 2.0 eV, comparable to that predicted by
The authors and chemical systems indexed in the 1998 Cumulative Index refer the user to all phase diagrams published in the Phase Equilibria Diagrams series up to August 1998: Volumes I through XII, Annuals 91, 92, 93, monographs entitled Phase Diagrams
Charles E. Bouldin, H Stragier, Bruce Ravel, L B. Sorensen
We have used a self-comsistent Kramers-Kr nig analysis of the diffraction anomalous fine structure (DAFS) signals to precisely determine the phase of a series of (00L) Bragg reflections in Yba 2Cu 3O 6.8. Our method is a new solution to the
The contents of this transaction volume comprise the proceedings of the Electronics Division Focused Session HighTemperature Superconductor Processing during the American Ceramic Society annual meeting at St. Louis, MO, from April29 to May 1, 2002.. A
M A. Sahiner, Joseph Woicik, P Gao, P McKeown, Mark Croft, M Gartman, B Benapfl
The continuous downward scaling of the complementary metal oxide semiconductor (CMOS) devices has enabled the Si-based semiconductor industry to meet the technological requirements such as high performance and low power consumption. However, the
L Gamble, D Radford, Daniel A. Fischer, D W. Grainger, David G. Castner
Self-assembled monolayers (SAMs) of perfluoroalkylthiols [CF 3(CF 2) xCH 2CH 2SH (x=3, 5, 7, and 9)] on gold were examined by X-ray photoelectron spectroscopy (XPS), near edge X-ray absorption fine structure (NEXAFS), and static time of flight secondary
B M. Haines, G E. Mitchell, Daniel A. Fischer, J L. Gland
The surface reactions of chlorobenzene on Pt(111) have been studied using temperature programmed reaction spectroscopy (TPRS) and fluorescence yield near edge spectroscopy (FYNES). Thermal hydrodechlorination, dehydrogenation and rehydrogenation result in
N M. Balzaretti, E J. Gonzalez, Gasper J. Piermarini, T Russell
The design and fabrication of a modified gem-anvil high pressure cell capable of statically heating gasketed samples to temperatures in the range of 1100 degrees C at pressures up to 4.0 Gpa is described. The high temperatures were achieved by resistance
F Lofaj, H Gu, A Okada, Sheldon M. Wiederhorn, H Kawamoto
The microstructure of a ytterbia- and yttria-containing grade of silicon nitride, SN 88, was investigated after it had been annealed in nitrogen, in air and crept in air. We were particularly interested in phase transformation within the secondary silicate