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T M. Schuler, D L. Ederer, S Itza-Ortiz, G T. Woods, T A. Callcott, Joseph Woicik
Abstract
Using site-specific soft x-ray emission and absoroption spectroscopy in conjunction with site-specific x-ray photoelectron spectroscopy, we measure the magnitude of the insulating band gap of NiO to be approximately 2.0 eV, comparable to that predicted by our density-functional theory calculations, and note that the insulating character of NiO arises from a mixture of charge-transfer and Mott-Hubbard character corresponding to the Zaanen-Sawatsky-Allen model.
Schuler, T.
, Ederer, D.
, Itza-Ortiz, S.
, Woods, G.
, Callcott, T.
and Woicik, J.
(2021),
NiO: A Charge Transfer or Mott-Hubbard Insulator, Physical Review Letters
(Accessed December 5, 2023)