New Correction Procedure for X-Ray Spectroscopic Fluorescence Data: Simulations and Experiments

Published

October 12, 2021

Author(s)

J Ablett, Joseph Woicik, C C. Kao

Abstract

X-ray fluorescence spectroscopy is a widely used method for determining the electronic configuration and local structure of dilute species with high sensitivity. In the dilute limit, and for thin films, the x-ray fluorescence signal is directly proportional to the atomic sub-shell absorption coefficient. However, for concentrated samples, the well-documented self-absorption effect often leads to the severe suppression of XANES (X-ray Absorption Near-Edge Structure) and EXAFS (Extended X-ray Absorption Fine-Structure) amplitudes. Thus to recover the real value of the sub-shell absorption coefficient, it is important to apply correction procedures to the measured fluorescence spectra. In this paper, we describe a new straightforward method to correct for self-absorption effects (the difference in the measured fluorescence signal compared to that of the true sub-shell photoabsorption coefficient) in XANES and EXAFS fluorescence measurements. Using a variety of sample and detector configurations, this method is used to extract the sub-shell absorption coefficient on elemental nickel and thick single-crystals of Gd3Ga5O12 and LaA1O3.

Proceedings Title

Proceedings| 53rd Annual Conference| Advances in X-Ray Analysis

Volume

48

Conference Dates

August 2-6, 2004

Conference Location

Undefined

Conference Title

Proceedings of the 52nd Annual Denver X-Ray Conference

Pub Type

Conferences

Keywords

EXAFS, Extended X-Ray Absorption Fine-Structure, self-absortion effect, sub-shell absorption coefficienct, X-Ray Absorption Near-Edge Structure, XANES

Citation

Ablett, J. , Woicik, J. and Kao, C. (2021), New Correction Procedure for X-Ray Spectroscopic Fluorescence Data: Simulations and Experiments, Proceedings| 53rd Annual Conference| Advances in X-Ray Analysis, Undefined (Accessed April 26, 2024)