New Correction Procedure for X-Ray Spectroscopic Fluorescence Data: Simulations and Experiments
J Ablett, Joseph Woicik, C C. Kao
X-ray fluorescence spectroscopy is a widely used method for determining the electronic configuration and local structure of dilute species with high sensitivity. In the dilute limit, and for thin films, the x-ray fluorescence signal is directly proportional to the atomic sub-shell absorption coefficient. However, for concentrated samples, the well-documented self-absorption effect often leads to the severe suppression of XANES (X-ray Absorption Near-Edge Structure) and EXAFS (Extended X-ray Absorption Fine-Structure) amplitudes. Thus to recover the real value of the sub-shell absorption coefficient, it is important to apply correction procedures to the measured fluorescence spectra. In this paper, we describe a new straightforward method to correct for self-absorption effects (the difference in the measured fluorescence signal compared to that of the true sub-shell photoabsorption coefficient) in XANES and EXAFS fluorescence measurements. Using a variety of sample and detector configurations, this method is used to extract the sub-shell absorption coefficient on elemental nickel and thick single-crystals of Gd3Ga5O12 and LaA1O3.
Proceedings| 53rd Annual Conference| Advances in X-Ray Analysis
August 2-6, 2004
Proceedings of the 52nd Annual Denver X-Ray Conference
, Woicik, J.
and Kao, C.
New Correction Procedure for X-Ray Spectroscopic Fluorescence Data: Simulations and Experiments, Proceedings| 53rd Annual Conference| Advances in X-Ray Analysis, Undefined
(Accessed December 7, 2023)