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NIST Pubs

Design, Manufacturing, and Inspection Data for a Three-Component Assembly

Author(s)
Thomas D. Hedberg, Michael E. Sharp, Toby M. Maw, Mostafizur M. Rahman, Swati Jadhav, James J. Whicker, Allison Barnard Feeney, Moneer M. Helu
To better understand and address the challenges faced in linking all stages of a manufacturing and design process, an investigative fabrication process was...

NIST Smart Grid Interoperability Test Tools

Author(s)
Dhananjay Anand, Kevin G. Brady, Yuyin Song, Cuong T. Nguyen, Kang B. Lee, Gerald J. FitzPatrick, Allen R. Goldstein, YaShian Li-Baboud
The National Institute of Standards and Technology (NIST), participated in the Universal Communication Architecture International User Group (UCAIug)...

NIST Micronutrients Measurement Quality Assurance Program: 1984-1985 Comparability Studies Results for Round Robins I, II, III and V Fat Soluble Vitamins and Carotenoids in Human Serum

Author(s)
Jeanice M. Brown Thomas, David L. Duewer, Margaret C. Kline, William A. MacCrehan, Robert Paule, Reenie Parris, Willie May, Robert Schaffer
From 1984 to 2017, the National Institute of Standards and Technology (NIST) and its precursor the National Burearu of Standards (NBS) coordinated what became...

Defining 'kind of quantity'

Author(s)
David W. Flater
The definition of 'kind of quantity' given in the International Vocabulary of Metrology (VIM), 3rd edition, does not cover the historical meaning of the term as...

Editorial: (Slight) Expansion in Scope for JPCRD

Author(s)
Allan H. Harvey, Donald R. Burgess Jr.
Editorial describing expansion of journal Scope for JPCRD to accept some original experimental and theoretical work if it provides "reference data" that can be...

Trustworthy email:

Author(s)
Scott Rose, J Stephen Nightingale, Simson Garfinkel, Ramaswamy Chandramouli

X-ray Metrology for the Semiconductor Industry Tutorial

Author(s)
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
The semiconductor industry is in need of new, in-line dimensional metrology methods with higher spatial resolution for characterizing their next generation...

Annual Manufacturing Review: 2018

Author(s)
Douglas Thomas
This annual report characterizes US innovation and industrial competitiveness in manufacturing. It includes tracking domestic manufacturing activity and its...
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