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NIST Pubs

Manufacturing USA: Rapid Response to COVID-19

Author(s)
Zahraha Brunner, Zachary Valdez, Donald Ufford
The report highlights the manufacturing innovation projects developed by the institutes and their partners across the country to combat COVID-19. Manufacturing...

Trust and Artificial Intelligence (Draft)

Author(s)
Brian Stanton, Theodore Jensen
WITHDRAWN January 4, 2023 The artificial intelligence (AI) revolution is upon us, with the promise of advances such as driverless cars, smart buildings...

Simulations of Flow Over an Axisymmetric Hill

Author(s)
Rikhi Bose, DongHun Yeo
In this report, high-Reynolds number turbulent flow around an axisymmetric hill is studied using large eddy and unsteady Reynolds averaged Navier-Stokes...

AWS-3 LTE Impacts on Aeronautical Mobile Telemetry

Author(s)
William F. Young, Duncan McGillivray, Adam Wunderlich, Mark Krangle, Jack Sklar, Aric Sanders, Keith Forsyth, Mark A. Lofquist, Dan Kuester
This technical report details an effort to design, demonstrate, and validate a test methodology to measure the impacts of Long Term Evolution (LTE) User...

Manufacturing USA 2019/2020 Highlights Report

Author(s)
Frank W. Gayle, Michael Molnar, John Roth, Zahraha Brunner
Manufacturing USA® is a network of public-private partnerships united to secure U.S. global leadership in advanced manufacturing through large scale...

NIST Time and Frequency Bulletin

Author(s)
Kelsey A. Rodriguez
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST...

Blockchain Networks: Token Design and Management Overview

Author(s)
Loic D. Lesavre, Priam C. Varin, Dylan J. Yaga
Blockchain technology has enabled a new software paradigm for managing digital ownership in partial- or zero-trust environments. It uses tokens to conduct...

National Institute of Standards and Technology Environmental Scan 2020

Author(s)
Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the...
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