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NIST Pubs

Electronics and Electrical Engineering Laboratory: Strategic Plan for Fiscal Years 1999-2004

January 1, 1999

Author(s)

R. M. Powell

The Electronics and Electrical Engineering Laboratory (EEEL) within the National Institute of Standards and Technology (NIST) strengthens the U.S. economy by

Overview of the Federal Technical Standards Conference

January 1, 1999

Author(s)

K J. Leuteritz

This past August 4-6 the first Federal Technical Standards Workshop was held in Washington, DC. The theme was Standards Management A World of Change and

Toward a National Standards Strategy to Meet Global Needs

January 1, 1999

Author(s)

W G. Leight, K J. Leuteritz

On September 23, 1998, the National Institute of Standards and Technology (NIST) and the American National Standards Institute (ANSI) co-hosted a summit

Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

January 1, 1999

Author(s)

Cedric J. Powell, Aleksander Jablonski

An analysis is given of the consistency of calculated and measured electron inelastic mean free paths (IMFPs) near solid surfaces for electron energies between

Design and Development of a Dictionary Translator

January 1, 1999

Author(s)

John V. Messina, James A. St Pierre, Michael R. McCaleb

The lack of a traceable set of terminologies to describe electronic components has long been identified by the electronic industry as a significant problem. As

Technical Activities 1998-Chemical Science and Technology Laboratory

January 1, 1999

Author(s)

Hratch G. Semerjian, W Koch

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and

Evaluation of the NASA Langley Research Center Mode-Stirred Chamber Facility

January 1, 1999

Author(s)

John M. Ladbury, Galen H. Koepke, Dennis G. Camell

We performed extensive tests on three mode-stirred (reverberation) chambers operated by the High Intensity Radiation Laboratory located at the National

Visualization of Bose-Einstein Condensates

January 1, 1999

Author(s)

P M. Ketcham, D L. Feder, W P. Reinhardt, Charles W. Clark, W L. George

An Analysis of Existing Ontological Systems for Applications in Manufacturing and Healthcare

January 1, 1999

Author(s)

Craig I. Schlenoff, Robert W. Ivester, Donald E. Libes, Peter O. Denno, Simon Szykman

The objective of the work described in this paper is to move closer to the ultimate goal of seamless system integration using the principle behind ontological

Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision

January 1, 1999

Author(s)

Eric Dauler, Gregg Jaeger, A Muller, Alan L. Migdall

An investigation is made of a recently introduced quantum interferometric method capable of measuring polarization mode dispersion (PMD) on sub-femtosecond

Digital Signature Standard (DSS)

December 15, 1998

Author(s)

Elaine B. Barker

[Superseded by FIPS 186-2 (January 27, 2000): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=] This standard specifies a suite of algorithms which

Report on the First-Generation NIST Convective Heat Flux Calibration Facility

December 10, 1998

Author(s)

David G. Holmberg, C A. Womeldorf

The National Institute of Standards and Technology has developed a convective heat flux calbration facility to allow evaluation of heat flux sensors. This

Testing of Interaction-driven Manufacturing Systems

December 2, 1998

Author(s)

Katherine C. Morris, David W. Flater, Donald E. Libes, Albert W. Jones

As automation of manufacturing processes becomes more widespread, manufacturing systems are becoming more and more software dependent. At the same time, the

Finite Precision Representation of the Conley Decomposition

December 1, 1998

Author(s)

Fern Y. Hunt

We present the theoretical basis for a novel way of studying and representing the long time behavior of finite dimensional maps. It is based on the sample paths

Initial CAALS Device Capability Dataset

December 1, 1998

Author(s)

Gary W. Kramer, T. A. Staab

Quantitative Infrared Database

December 1, 1998

Author(s)

Pamela M. Chu, Franklin R. Guenther, George C. Rhoderick, W J. Lafferty

NIST Chemical Kinetics Database

December 1, 1998

Author(s)

William G. Mallard, F Westley, J T. Herron, Robert F. Hampson, D H. Frizzell

Thermodynamic Properties of Water: Tabulation from the IAPWS Formulation 1995 for the Thermodynamic Properties of Ordinary Water Substance for General and Scientific Use

December 1, 1998

Author(s)

Allan H. Harvey

A Framework for Component-based CNC Machines

December 1, 1998

Author(s)

John L. Michaloski, S Birla, G Weinert, C J. Yen

Open architecture technology is ushering in new advances in the world of computer numerically controlled (CNC) machines. Yet, some major benefits of open

Annotated Bibliography: Works by Staff of the Economic Assessment Office and its Contractors

December 1, 1998

Author(s)

R N. Spivack

This annotated bibliography contains all of the completed studies of the ATP prepared by the staff of the Economic Assessment Office and its contractors.

Analysis and Comparison of Various Image Downsampling and Unsampling Methods

December 1, 1998

Author(s)

Abdou S. Youssef

Downsampling and upsampling are widely used in image display, and jointly used in compression and progressive transmission. In this paper we examine new down

Parallel Algorithms for Multi-Indexed Recurrence Relations With Applications to DPCM Image Compression

December 1, 1998

Author(s)

Abdou S. Youssef

Parallel solution of 1-indexed recurrence relations has received much attention, but no effort has been made to design parallel algorithms for multi-indexed

Parallel Algorithms for Entropy-Coding Techniques

December 1, 1998

Author(s)

Abdou S. Youssef

With the explosion of imaging applications, and due to the massive amounts of imagery data, data compression is essential. Lossless compression also called

Near Infrared 45{degrees}/0{degrees} Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder

December 1, 1998

Author(s)

Maria E. Nadal, P Y. Barnes

Pressed polytetrafluoroethylene (PTFE) powder is commonly used as a reflectance standard for bi-directional and hemispherical geometry. The radiometric and

Spectroradiometric Detector Measurements: Part III--Infrared Detectors

December 1, 1998

Author(s)

Alan L. Migdall, George P. Eppeldauer

The National Institute of Standards and Technology (NIST) supplies calibrations of IR photodetector's spectral radiant power response from 1.8 υm to 20 υm. The

Spectral Response Based Calibration Method of Tristimulus Colorimeters

December 1, 1998

Author(s)

George P. Eppeldauer

The accuracy of tristimulus colorimeters can be increased by using detector standards instead of traditional lamp standards for calibration. After high accuracy

EEEL Technical Accomplishments 98 Advancing Metrology for Electrotechnology to Support U.S. Economy

December 1, 1998

Author(s)

JoAnne M. Surette

The Electronics and Electrical Engineering Laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement and other generic

Procedures for Obtaining NIST Recognition as an Accrediton of Quality System Registrars Under the Fastener Quality Act

December 1, 1998

Author(s)

S. W. Stiefel, R L. Gladhill

On November 16, 1990, the United States Congress enacted the Fastener Quality Act (FQA), P.L. 101-592 (the Act). The Act was amended in 1996 by Section 11 of P

Accreditation Requirements for Quality System Registrars Under Provisions of the Fastener Quality Act

December 1, 1998

Author(s)

S. W. Stiefel, R L. Gladhill

On November 16, 1990, the United States Congress enacted the Fastener Quality Act (FQA), P.L. 101-592 (the Act). The Act was amended in 1996 by Section 11 of P

Directory of Federal Government Certification and Related Programs

December 1, 1998

Author(s)

Maureen A. Breitenberg

This directory is the third edition of the National Institute of Standards and Technology (NIST) directory of federal government procurement and regulatory

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