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NIST Pubs

A Double-Primary Dead-Weight Tester for Pressures (35-175) kPa in Gage Mode

February 1, 2003

Author(s)

K. Jain, Y Q. Cen, Walter J. Bowers Jr., James W. Schmidt

Primary pressure standards in the atmospheric pressure range are often established using mercury manometers. Less frequently, controlled-clearance dead-weight...

Automated Security Self-Evaluation Tool Technical Documentation, Version 1.03

January 31, 2003

Author(s)

Mark McLarnon, Marianne M. Swanson

The Automated Security Self-Evaluation Tool (ASSET) automates the process of completing a system self-assessment. ASSET will assist organizations in completing...

Results from Simulation and Laboratory Testing of Air Handling Unit and Variable Air Volume Box Diagnostic Tools

January 31, 2003

Author(s)

Natascha S. Milesi-Ferretti, J Schein, Cheol D. Park, Michael A. Galler, Steven T. Bushby, J House

Control of building systems is increasingly more intelligent and complex. This development both necessitates the use of automated diagnostics to ensure fault...

Building & fire research laboratory ::activities, accomplishments & recognitions 2003

January 1, 2003

Author(s)

Kellie A Beall, James E Hill

Directory of state and local government laboratory accreditationdesignation programs:

January 1, 2003

Author(s)

Charles W Hyer, Charles W Hyer

Security considerations in the information system development life cycle:

January 1, 2003

Author(s)

T Grance, J Hash, M Stevens

Guideline for identifying an information system as a national security system:

January 1, 2003

Author(s)

W C Barker

Security metrics guide for information technology systems:

January 1, 2003

Author(s)

M Swanson, N Bartol, J Sabato, J Hash, L Graffo

Building an Information Technology Security Awareness and Training Program:

January 1, 2003

Author(s)

M Wilson, J Hash

Guideline on network security testing:

January 1, 2003

Author(s)

J P Wack, M C Tracy, M P Souppaya

Guide to selecting information technology security products:

January 1, 2003

Author(s)

T Grance, M Stevens, M Myers

Guide to information technology security services:

January 1, 2003

Author(s)

T Grance, J Hash, M Stevens, K O'Neal, N Bartol

GLUTTk ::OpenGL with TclTk

January 1, 2003

Author(s)

Joseph C Konczal

The eleventh text REtrieval conference, TREC 2002:

January 1, 2003

Author(s)

Ellen M Voorhees, Lori P Buckland

NIST Standard Reference Materials catalog February 2003:

January 1, 2003

Author(s)

Joylene W L Thomas, Yvonne A Branden, Robbin D Howard

Standard reference materials ::human mitochondrial DNA--amplification and sequencing - standard reference materials--SRM 2392 and SRM 2392-1

January 1, 2003

Author(s)

B C Levin, D K Hancock, K A Holland, H Cheng, K L Richie

Standard Reference Materials:Certification of a polystyrene synthetic polymer, SRM 2888

January 1, 2003

Author(s)

William R Blair, Robert J Goldschmidt, David L VanderHart, William E Wallace, Stephanie J Wetzel, Charles M Guttman

The NIST-traceable reference-material program for wavelength-reference absorption cells:

January 1, 2003

Author(s)

Sarah L Gilbert, Chih-Ming Wang, Timothy J Drapela

Standard Reference Materials ::the first century/

January 1, 2003

Author(s)

Stanley D Rasberry

Standard Reference Materials ::Value assignment and uncertainty estimation of selected light stable isotope reference materials /

January 1, 2003

Author(s)

Donna B Klinedinst, R Michael Verkouteren

Standard reference materials ::certification of standard reference material 1474a, a polyethylene resin

January 1, 2003

Author(s)

J R Maurey, Kathleen M Flynn, C M Guttman

Standard reference materials ::certification of the rheological behavior of SRM 2491, polydimethylsiloxane

January 1, 2003

Author(s)

Carl R Schultheisz, Kathleen M Flynn, Stefan D Leigh

High-accuracy laser power and energy meter calibration service:

January 1, 2003

Author(s)

David Livigni

NIST measurement services ::measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm

January 1, 2003

Author(s)

Rex M Craig, Chih-Ming Wang

Performance measures for intelligent systems ::measures of technology readiness

January 1, 2003

Author(s)

Alexander Meystel, Jim Albus, Elena Messina, Dennis Leedom

Report of the 88th National Conference on Weights and Measures:

January 1, 2003

Author(s)

Henry V Oppermann

Thirteenth international conference on computerization of welding:

January 1, 2003

Author(s)

T A Siewart, W G Rippey

The NIST 3 megawatt quantitative heat release rate facility:

January 1, 2003

Author(s)

Rodney A Bryant, Rodney A Bryant

Unwanted accelerated burning after suppressant delivery:

January 1, 2003

Author(s)

Anthony Hamins, Kevin McGrattan, Glenn Forney

Ultra-high molecular weight polyethylene wear particle effects on bioactivity:

January 1, 2003

Author(s)

Hsu-Wei Fang, Stephen M Hsu, Jan V Sengers

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