Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Second Workshop on Wireless Sensing Proceedings

Published

Author(s)

James D. Gilsinn, Kang B. Lee, Richard D. Schneeman, Hui-Min Huang

Abstract

The second Workshop on Wireless Sensing was held on October 4, 2001, at the Sensors Expo & Conference at the Philadelphia Convention Center in Philadelphia, PA. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors Conference, Institute of Electrical and Electronics Engineers (IEEE) Instrumentation and Measurement society?s Technical Committee on Sensor Technology (TC-9), and IEEE sensors Council cosponsored the workshop. NIST is an agency of the U.S. Department of Commerce?s Technology Administration. Its mission is to help increase U.S. industry competitiveness through advanced research, standards, and technology collaboration. Recently, there has been considerable interest from industry and government in applying wireless technology to sensor-based applications. Wireless technology has seen an explosion over the last couple years with the introduction of Bluetooth and higher speed wireless Ethernet. These technologies are moving from the office environment to the industrial plant floor as engineers discover how flexible and easy to use they are.
Citation
NIST Interagency/Internal Report (NISTIR) - 6930
Report Number
6930

Keywords

Bluetooth, Ethernet, IEEE 1451, sensing, smart sensors, wireless

Citation

Gilsinn, J. , Lee, K. , Schneeman, R. and Huang, H. (2002), Second Workshop on Wireless Sensing Proceedings, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 2002, Updated February 19, 2017