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V W. Tsai, S. Wang, E. C. Williams, J Schneir, Ronald G. Dixson
The characteristics of the Si-vacuum interface were compared with the characteristics of the oxide-air interface formed following room temperature oxidation for...
We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of...
Paul Rice, Stephen Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force...
The Bienaym?-Chebyshev Inequality provides a quantitative bound on the level of confidence of a measurement with known combined standard uncertainty and assumed...
Direct implementation of extended arithmetic operators on fuzzy numbers is computationally complex. Implementation of the extension principle is equivalent to...
A new method of describing designs by combining the paradigms of shape aglebras and predicate logic representations is presented. Representing shapes and...
We demonstrate an automated polarimeter based on a rotating polarizer for the measurement oflinear retardance independent oflaser power and detector gain. The...
This paper reports recent progress in the development of a generic molecular dynamics model that accounts for the major chemical reactions involved in the...
A Bard, K K. Berggren, J L. Wilbur, John D. Gillaspy, S L. Rolston, Jabez J. McClelland, William D. Phillips, M Prentiss, G M. Whitesides
We used a beam of noble gas atoms in a metastable excited state to expose a thin (1.5nm self-assembled monolayer resist applied over a gold-coated silicon wafer...
This paper proposes a method to extend the current ISO Guide to the Expression of Uncertainty in Measurement to include the case of known, but uncorrected...
Michael Gruninger, Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
This paper addresses the issue of process ontology integration using a complete set of process information requirements as its basis. The goals of the paper...
This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community...
William T. Estler, Christopher J. Evans, Lianzhen Shao
We analyze a general multiposition comparator measurement procedure that leads to partial removal of artifact error for a class of problems including roundness...