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Optimizing the NIST Magnetic Imaging Reference Sample



Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley


We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurements have shown the variability in images taken with different tips and different instrument configuration which underscores the need for a well calibrated sample.
IEEE Transactions on Magnetics


Rice, P. , Russek, S. , Hoinville, J. and Kelley, M. (1997), Optimizing the NIST Magnetic Imaging Reference Sample, IEEE Transactions on Magnetics (Accessed December 7, 2023)
Created August 31, 1997, Updated October 12, 2021