Wakid, S.
and Radack, S.
(1997),
Overview for Special Issue of Standard View, Standard View
(Accessed May 9, 2025)
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Overview for Special Issue of Standard View
Published
Author(s)
,
Abstract
This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community are explored. A series of papers are presented in the Special Issue to look at some of the first steps that are underway toward establishing a needed measurement base for information technology. The introduction briefly discusses the various papers and their relationships to each other and to the overall issue of measurements for information technology.Citation
Standard View
Volume
5
Issue
No. 3
Pub Type
Journals
Keywords
conformance tests, conformity assessments, electronic commerce, information technology, measurements, metrology, standards, traceability
Citation
Issues
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Created August 31, 1997, Updated October 12, 2021