An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Uncertainty Estimation for Multiposition Form Error Metrology
Published
Author(s)
William T. Estler, Christopher J. Evans, Lianzhen Shao
Abstract
We analyze a general multiposition comparator measurement procedure that leads to partial removal of artifact error for a class of problems including roundness metrology, measurement of radial error motions of precision spindles, and figure error metrology of high-accuracy optical components. Using spindle radial error motion as an explicit example, we present a detailed analysis of a complete test with N orientation of a test ball with respect to the spindle. In particular, we show that (1) all components of the ball roundness error average to zero except those with frequencies of kN cycles/revolution, where k is a positive integer; and (2) the combined standard uncertainty of the measurement is proportional to 1/sqrt(N). We then show how a complete set of measurements for an N-position test can be synthesized from only two measurements, and we derive a general expression for the combined standard uncertainty as a function of the number of positions n (2 < n < N) actually measured in an N-position test. This uncertainty can serve as a useful guide to measurement design, involving trade-offs between multiple setup cost and complexity and required levels of angular harmonic resolution and combined standard measurement uncertainty.
Citation
Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology
Estler, W.
, Evans, C.
and Shao, L.
(1997),
Uncertainty Estimation for Multiposition Form Error Metrology, Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology
(Accessed September 7, 2024)