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Journals

Characterization of a Suite of Ginkgo-Containing Standard Reference Materials

Author(s)
Catherine A. Rimmer, S. Howerton, Katherine E. Sharpless, Lane C. Sander, Stephen E. Long, Karen E. Murphy, Barbara J. Porter, K. Putzbach, M. S. Rearick, Stephen A. Wise, Laura J. Wood, Rolf L. Zeisler, Diane K. Hancock, James H. Yen, J. M. Betz, A. NguyenPho, L. Yang, C. Scriver, S. N. Willie, R. Sturgeon, B. Schaneberg, C. Nelson, J. Skamarack, M. Pan, L. Kerri, D. Gray, E. H. Waysek, A. Blatter, E. Reich

Inkjet Metrology and Standards for Ion Mobility Spectrometry

Author(s)
R M. Verkouteren, J Brazin, Eric S. Windsor, Robert A. Fletcher, R Maditz, Wayne Smith, John G. Gillen
Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference

SAMATE and Evaluating Static Analysis Tools

Author(s)
Paul E. Black
We give some background on the Software Assurance Metrics And Tool Evaluation (SAMATE) project and our decision to work on static source code security analyzers

Nanosecond Delay With Subpicosecond Uncertainty

Author(s)
Donald R. Larson, Nicholas Paulter
We have combined a commercially available, variable length coaxial delay line (trombone line) with a high resolution linear translation system. The result is
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