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Probing molecules in integrated solid-state silicon junctions

Published

Author(s)

Wenyong Wang, Adina Scott, Nadine Gergel-Hackett, Christina Hacker, David Janes, Curt A. Richter

Abstract

In this research work, we fabricate integrated Si-SAMs-metal devices using the ?soft? top metal deposition technique and probe their electronic properties with IETS characterizations. IETS confirmed the existence of molecular species in the device area.
Citation
Nano Letters
Volume
8
Issue
2

Keywords

inelastics electron tunneling, self-assembled monolayer, silicon

Citation

Wang, W. , Scott, A. , Gergel-Hackett, N. , Hacker, C. , Janes, D. and Richter, C. (2008), Probing molecules in integrated solid-state silicon junctions, Nano Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32700 (Accessed April 20, 2024)
Created January 11, 2008, Updated October 12, 2021