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Journals

Dislocation nucleation during nanoindentation of aluminum

Author(s)
Richard J. Wagner, Li Ma, Francesca M. Tavazza, Lyle E. Levine
Through multiscale simulations, we explore the influence of an atomically-rough indenter tip on the nucleation of dislocations during nanoindentation of single

A review of time and frequency transfer methods

Author(s)
Judah Levine
I will discuss three methods of transmitting time and frequency information: one-way, two-way and common-view. I will describe the advantages and limitations of

Realizing UTC (NIST) at a Remote Location

Author(s)
Judah Levine
I will describe the backup time scale system that I have constructed at the site of the NIST radio stations near Fort Collins, Colorado, and I will compare its

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

Author(s)
Lucile C. Teague, Behrang H. Hamadani, John E. Anthony, David J. Gundlach, James G. Kushmerick, Sanker Subramanian, Thomas Jackson, Curt A. Richter, Oana Jurchescu
We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film

The SIM Time and Frequency Network

Author(s)
Michael A. Lombardi, Andrew N. Novick, Jose M. Lopez, Francisco Jimenez, Jean-Simon Boulanger, Raymond Pelletier, Ricardo de Carvalho, Raul Solis, Carlos Donado, Harold Sanchez, Carlos A. Quevedo, Gregory Pascoe, Daniel Perez
The Sistema Interamericano de Metrologia (SIM) consists of national metrology institutes (NMIs) located in the 34 member nations of the Organization of American

Keeping time in three dimensions

Author(s)
Christopher W. Oates
Here I review a paper by Akatsuka et al. that appears in the current volume of Nature Physics. This work describes their latest experimental results on optical
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