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PUBLICATIONS

Vector characterization of high-speed components using linear optical sampling with milliradian resolution

Published

Author(s)

Paul A. Williams, Tasshi Dennis, Ian R. Coddington, William C. Swann, Nathan R. Newbury

Abstract

We demonstrate linear optical sampling measurements optimized for characterization of the signals produced by optical components. By sampling the optical electric field before and after the component, we isolate the full vector field (phase and amplitude) of the signal separate from the input laser drift. Synchronization of the low-jitter mode-locked sampling laser (e.g., frequency comb) with the modulation rate allows measurement of the phase with milliradian noise. As a demonstration, we measure 10-Gb/s differential phase-shift keying modulated data with several different lasers. The technique is readily scalable to systems of much higher bandwidth.
Citation
IEEE Photonics Technology Letters
Volume
20
Issue
23
Pub Type
Journals

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Keywords

Linear optical sampling, DPSK, optical phase monitoring
Optical physics and communications

Citation

Williams, P. , Dennis, T. , Coddington, I. , Swann, W. and Newbury, N. (2008), Vector characterization of high-speed components using linear optical sampling with milliradian resolution, IEEE Photonics Technology Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33127 (Accessed December 14, 2024)

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Created December 1, 2008, Updated February 19, 2017