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Journals

International Intercomparison of Detector Responsivity at 1300 and 1550 nm

December 1, 1992

Author(s)

J. L. Gardner, R. L. Gallawa, K. D. Stock, D. H. Nettleton

Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides

December 1, 1992

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman

Localized Plasma Etching for Device Optimization

December 1, 1992

Author(s)

Donald R. Larson, D. L. Veasey

Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

December 1, 1992

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown

Voltage Gain in the Single-Electron Transistor

November 23, 1992

Author(s)

G. Zimmerli, Richard L. Kautz, John M. Martinis

A Dynamic Electro-Thermal Model for the IGBT

November 16, 1992

Author(s)

Allen R. Hefner Jr.

Flow of microemulsions through microscopic pores

November 15, 1992

Author(s)

Dean Ripple, Robert Berg

The flow of the microemulsion dioctylsulfosuccinate (AOT)/decane/water through 0.1 and 1.0 um diameter pores was studied for water droplet volume fractions...

Nd:LiTaO₃ Waveguide Laser

November 15, 1992

Author(s)

Norman Sanford, J. A. Aust, K. J. Malone, Donald R. Larson, Alexana Roshko

Yba₂Cu₃O_7-x to Si Interconnection for Hybrid Superconductor/Semiconductor Integration

November 2, 1992

Author(s)

Todd E. Harvey, John M. Moreland, Blaise Jeanneret, Ronald H. Ono, David A. Rudman

Currents Induced on Multiconductor Transmission Lines by Radiation and Injection

November 1, 1992

Author(s)

David A. Hill

Electromagnetic Scattering by a Periodic Surface with a Wedge Profile

November 1, 1992

Author(s)

David A. Hill

Determination of Complex Scattering Amplitudes in Low-Energy Elastic Electron-Sodium Scattering

November 1, 1992

Author(s)

Jabez McClelland, Steven R. Lorentz, R E. Scholten, Michael H. Kelley, Robert Celotta

Measurements of spin-resolved elastic electron-sodium scattering have been carried out at incident energies of 4.1 and 12.1 eV, and the ratio of triplet to...

STEP -- Standard for the Exchange of Product Model Data

November 1, 1992

Author(s)

Howard Bloom

This note provides a brief description on the definition of the STandard for the Exchange of Product model data (STEP) and how it will be used by the Department...

Accuracy of the Electron Pump

November 1, 1992

Author(s)

H. D. Jensen, John M. Martinis

High-Level CAD Melds Micromachined Devices with Foundries

November 1, 1992

Author(s)

Janet M. Cassard, M. Parameswaran, Mona E. Zaghloul, Michael Gaitan

Techniques and Characterization of Pulsed Electromigration at the Wafer Level

November 1, 1992

Author(s)

John S. Suehle, Harry A. Schafft

Ion Kinetic-Energy Distributions in Argon rf Glow Discharges

November 1, 1992

Author(s)

James K. Olthoff, Richard J. Van Brunt, S. B. Radovanov

Validating Surge Test Standards by Field Experience: High-Energy Tests and Varistor Performance

November 1, 1992

Author(s)

Charles D. Fenimore, Francois D. Martzloff

Offset Susceptibility of Superconductors

November 1, 1992

Author(s)

T Ishida, Ronald B. Goldfarb, Anthony B. Kos, R W. Cross

Ring OpeningPolymerization of Cyclooefins by Tungsten(VI) Chloride - Acetylene Catalyst Systems.

October 15, 1992

Author(s)

Anzor Mikaia, Kirill Makovetsky, Ludmila Gorbacheva, Irina Ostrovskaya, Alexander Golberg, Anna Zakharyan, Marina Filatova

Real time GC-MS experiments are employed for the study of a reaction between Phenylacetylene and WCl6

Robust Estimation in Parameter Extraction

October 1, 1992

Author(s)

Charles D. Fenimore, Y. X. Zhang

Wafer Probe Transducer Efficiency

October 1, 1992

Author(s)

Dylan F. Williams, Roger Marks, Dave K. Walker, Fred R. Clague

Experimental evidence is presented that shows the conventional expression relating the transducer efficiency of a two-port to measured scattering parameters is...