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Journals

Direct Observation of Macroscopic Charge Quantization

Author(s)
P Lafarge, H Pothier, Edwin R. Williams, D Esteve, C Urbina, Michel H. Devoret
The circuit formed by a nanoscale tunnel junction in series with a capacitance and a voltage source is the building block of most multi-junction circuits of

Modeling Dynamic Surfaces with Octrees

Author(s)
Don E. Libes
Past uses of octrees have been for representing of static objects. We discuss extensions necessary to model dynamic surfaces. One particularly important aspect

Transmission Line Capacitance Measurement

Author(s)
Dylan F. Williams, Roger Marks
The capacitance of coplanar lines is measured with two new techniques, one utilizing the resistance of the line and the other that of a resistor embedded in the

Laser Focusing of Atoms: A Particle Optics Approach

Author(s)
Jabez J. McClelland, M Scheinfein
The use of a TEM 01 *-mode laser beam has been proposed as a means of focusing an atomic beam to nanometer-scale spot diameters. We have analyzed the classibal

ALPS: A Language for Process Specification

Author(s)
Brian Catron, Steven R. Ray
This paper describes research identifying information models to facilitate process specification and to transfer this information to process control. A
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