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Conferences

VAMAS Interlaboratory Comparisons of Critical Current vs. Strain in Nb₃Sn Superconductors

January 1, 1989

Author(s)

John (Jack) W. Ekin, John W. West

Thermal Contraction of Fiberglass-Epoxy Sample Mandrels and its Effect on Critical-Current Measurements

January 1, 1989

Author(s)

Loren F. Goodrich, S L. Bray, Theodore C. Stauffer

SQL: A Query Language for Manipulation Object-oriented Databases

January 1, 1989

Author(s)

Stanley Su, A Alashqur, H Lam

An essential property which is desirable in a query language designed for a certain data model is that queries issued in that language must produce results that

Surface Characterization and Testing II

January 1, 1989

Author(s)

J. E. Grievenkamp, M. Young

Soliton-Like Compression of Pulses from Erbium-Fiber Lasers

January 1, 1989

Author(s)

John B. Schlager, Y. Yamabayashi, Douglas L. Franzen

Polarimetric Magnetic Field Sensors Based on Yttrium Iron Garnet

January 1, 1989

Author(s)

M. N. Deeter, Allen Rose, Gordon W. Day

NIST Optical Power Measurements

January 1, 1989

Author(s)

Thomas Scott

Analytical Modeling of Device-Circuit Interactions for the Power Insulated Gate Bipolar Transistor (IGBT)

December 31, 1988

Author(s)

Allen R. Hefner Jr.

The Effect of High Injection on the Density of States of Silicon

December 31, 1988

Author(s)

J R. Lowney

A Review of Thermal Characterization of Power Transistors

December 31, 1988

Author(s)

David L. Blackburn

Submicrometer Optical Metrology

December 31, 1988

Author(s)

Robert D. Larrabee

Power MOSFET Failure Revisited, PESC '88 Record

December 31, 1988

Author(s)

David L. Blackburn

Analytical Modeling of Device-Circuit Interactions for the Insulated Gate Bipolar Transistor (IGBT)

December 31, 1988

Author(s)

Allen R. Hefner Jr.

Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa₂Cu₃O₇

December 31, 1988

Author(s)

Ronald H. Ono, James A. Beall, John (Jack) W. Ekin, A. J. Nelson, L. L. Kazmerski, A. R. Mason, A. B. Swartzlander, R. McConnell

Selected Area channeling Pattern and Defect Etch Study of Silicon Implanted with Oxygen, MIcrobeam Analysis - 1988

December 31, 1988

Author(s)

Peter Roitman, G. E. Davis

A Developmental Expert System for Test Structure Data Evaluation

December 31, 1988

Author(s)

Loren W. Linholm, D. Khera, C. P. Reeve, Michael W. Cresswell

Low Accelerating Voltage SEM Magnification Standard Prototype

December 31, 1988

Author(s)

Michael T. Postek, R. C. Tiberio

Thermal Interactions Between Electromigration Test Structures

December 31, 1988

Author(s)

Harry A. Schafft, John Albers

Evaluation of Single Point Diamond Turning Tools

December 31, 1988

Author(s)

C J. Evans, R. Polvani, Michael T. Postek, Gordon W. Day

Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

December 31, 1988

Author(s)

John S. Suehle, Kathleen Gallo

A Microelectronic Test Structure for Thickness Determination of Homogeneous Conducting Thin Films in VLSI Processing

December 31, 1988

Author(s)

Jin S. Kim, Loren W. Linholm, B. L. Barley, M. H. Hanes, Michael W. Cresswell

Progress Toward a Semiconductor Depth-Profiling Standard

December 31, 1988

Author(s)

David S. Simons, P Chi, R. G. Downing, James R. Ehrstein, J. F. Knudsen

Statistics for Electromigration Testing

December 31, 1988

Author(s)

Harry A. Schafft, J. A. Lechner, B. Sabi, M. Mahaney, R P. Smith

A New Approach to Image Modeling and Edge Detection in the SEM

December 31, 1988

Author(s)

D. Nyyssonen

A Steady-State Model for the Insulated Gate Bipolar Transistor

December 31, 1988

Author(s)

Allen R. Hefner Jr., David L. Blackburn, Kathleen Gallo

CMOS Process Monitor

December 31, 1988

Author(s)

M. G. Buehler, Loren W. Linholm, V. C. Tyree, Richard A. Allen, B. R. Blaes, K. A. Hicks, G. A. Jennings

How Good Are Your Estimates of t₅₀ and Δ

December 31, 1988

Author(s)

Harry A. Schafft, J. A. Lechner, B. Sabi, R P. Smith

Artifacts Observed in Oxygen Profiles of SIMOX Samples by Secondary Ion Mass Spectrometry

December 31, 1988

Author(s)

P Chi, David S. Simons, Peter Roitman

NASREM: Robot Control System and Testbed

November 18, 1988

Author(s)

Ronald Lumia, J Fiala, Albert J. Wavering

NASA

Role of Off-Line Robot Programming in Hierarchical Control

November 18, 1988

Author(s)

Nicholas Tarnoff, Ronald Lumia

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