Geyer, R.
(1990),
Electrodynamics of Materials for Dielectric Measurement Standardization, Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA
(Accessed May 9, 2025)
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Electrodynamics of Materials for Dielectric Measurement Standardization
Published
Author(s)
Proceedings Title
Proc., IEEE Instrum. Meas. Tech. Conf.
Conference Dates
February 13-15, 1990
Conference Location
San Jose, CA
Pub Type
Conferences
Citation
Issues
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Created February 1, 1990, Updated February 19, 2017