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Electrodynamics of Materials for Dielectric Measurement Standardization

Published

Author(s)

Richard G. Geyer
Proceedings Title
Proc., IEEE Instrum. Meas. Tech. Conf.
Conference Dates
February 13-15, 1990
Conference Location
San Jose, CA

Citation

Geyer, R. (1990), Electrodynamics of Materials for Dielectric Measurement Standardization, Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA (Accessed June 15, 2024)

Issues

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Created February 1, 1990, Updated February 19, 2017