TY  - CONF
AU  - Richard Geyer
C2  - Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA
DA  - 1990-02-01
LA  - en
PB  - Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA
PY  - 1990
TI  - Electrodynamics of Materials for Dielectric Measurement Standardization
ER  -