Suehle, J.
and Schafft, H.
(1990),
Current Density Dependence of Electromigration t<sub>50</sub> Enhancement Due to Pulsed Operation, Proc., 28th Annual Reliability Physics 1990, New Orleans, LA, USA
(Accessed May 12, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Current Density Dependence of Electromigration t50 Enhancement Due to Pulsed Operation
Published
Author(s)
,
Proceedings Title
Proc., 28th Annual Reliability Physics 1990
Conference Dates
March 27-29, 1990
Conference Location
New Orleans, LA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 1990, Updated October 12, 2021