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Current Density Dependence of Electromigration t50 Enhancement Due to Pulsed Operation

Published

Author(s)

John S. Suehle, Harry A. Schafft
Proceedings Title
Proc., 28th Annual Reliability Physics 1990
Conference Dates
March 27-29, 1990
Conference Location
New Orleans, LA, USA

Citation

Suehle, J. and Schafft, H. (1990), Current Density Dependence of Electromigration t<sub>50</sub> Enhancement Due to Pulsed Operation, Proc., 28th Annual Reliability Physics 1990, New Orleans, LA, USA (Accessed April 14, 2024)
Created February 28, 1990, Updated October 12, 2021