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Conferences

Analysis of the YBa₂Cu₃O₇/SrTiO₃ Interface as a Function of Post-Deposition Annealing

December 31, 1989

Author(s)

S. E. Asher, A. J. Nelson, A. R. Mason, A. B. Swartzlander, R. G. Dhere, L. L. Kazmerski, J. Halbritter, Todd E. Harvey, James A. Beall, Ronald H. Ono

Microlithography and Patterning of High-T_c Thin Films

December 31, 1989

Author(s)

Ronald H. Ono, James A. Beall

Electrical Characterization of Beta Silicon Carbide MIS Capacitors with Thermally Grown or Chemical-Vapor-Deposited Oxides

December 31, 1989

Author(s)

Joseph Kopanski, Donald B. Novotny

An ac Impedance Method for High-Resistivity Measurements of Silicon

December 31, 1989

Author(s)

W. R. Thurber, J R. Lowney, Robert D. Larrabee, P. Talwar, James R. Ehrstein

Technology Transfer at NIST

December 31, 1989

Author(s)

Brian C. Belanger, Herbert S. Bennett, Loren W. Linholm, Thomas J. Russell, Harry A. Schafft

Thermal Conductivity Measurements of Thin-Film Silicon Dioxide

December 31, 1989

Author(s)

Harry A. Schafft, John S. Suehle, P. G. Mirel

Experimental Verification of the Relation Between Two-Probe and Four-Probe Resistances

December 31, 1989

Author(s)

Joseph Kopanski, John Albers, G. P. Carver

The Electromigration Damage Response Time and Implications for dc and Pulsed Characterizations

December 31, 1989

Author(s)

John S. Suehle, Harry A. Schafft

Materials Problems Affecting Reliability and Yield of Wire Bonding in VLSI Devices

December 31, 1989

Author(s)

George G. Harman, Charles L. Wilson

The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

December 31, 1989

Author(s)

John S. Suehle, Kathleen Gallo

Small Signal Modeling of the MOSOS Capacitor

December 31, 1989

Author(s)

Michael Gaitan, Peter Roitman

Effect of Annealing Conditions on Precipitate and Defect Evolution in Oxygen Implanted SOI Material

December 31, 1989

Author(s)

S. J. Krause, S. Visitserngtrakul, B. F. Cordts, Peter Roitman

A Neural Network Approach for Classifying Test Structure Results

December 31, 1989

Author(s)

D. Khera, Mona E. Zaghloul, Loren W. Linholm, Charles L. Wilson

Metrological Electron Microscope for the Certification of Magnification and Linewidth Artifacts for the Semiconductor Industry

December 31, 1989

Author(s)

Michael T. Postek, William J. Keery, S. Jones

Advanced Deburring System Technology

December 15, 1989

Author(s)

Frederick M. Proctor, Karl Murphy

Development of On-Wafer Microwave Standards at NIST

December 1, 1989

Author(s)

Dylan F. Williams

Wafer-Level ANA Calibrations at NIST

December 1, 1989

Author(s)

Roger Marks, K. R. Phillips

Preliminary Microwave Complex Permittivity Measurements of Heavy-Metal Fluoride Glasses

November 1, 1989

Author(s)

Richard G. Geyer, Michael D. Janezic, W. A. Kissick, James R. Baker-Jarvis

Concurrent Turbulent Flame Spread.

October 19, 1989

Author(s)

L Zhou, A C. Fernandez-Pello

The rate of flame spread over the surface of thick PMMA sheets has been measured as a function of the velocity and turbulence intensity of a forced air flow...

Concept of a Performance Based Design Method for Building Fire Safety.

October 19, 1989

Author(s)

T Tanaka

Collaborative Experiment of Interior Lining Materials.

October 19, 1989

Author(s)

Y Hasemi

Burning of Oil Spills.

October 19, 1989

Author(s)

William D. Walton, D D. Evans

This study is directed at understanding the oil spill combustion process and the smoke generated from the burning. Measurements of 1.2 m diameter Murban crude...

Burning Behavior in a Poorly-Ventilated Compartment Fire--Ghosting Fire.

October 19, 1989

Author(s)

O Sugawa, K Kawagoe, Y Oka

Analysis on Fatalities' Characteristics of Residential Fires.

October 19, 1989

Author(s)

A Sekizawa

NASREM -- The NASA/NBS Standard Reference Model for Telerobot Control System Architecture

October 6, 1989

Author(s)

James S. Albus, Ronald Lumia, J Fiala, Albert J. Wavering

There are five major elements required for the development of an intelligent robot system. Four of these are architectures: 1. Conceptual architecture 2...

Antenna Far-Field Pattern Accuracies at Millimeter Wave Frequencies Using the Planar Near-Field Technique

October 1, 1989

Author(s)

Michael H. Francis

The Role of the National Institute of Standards and Technology as it Relates to the Implementation of PDES

October 1, 1989

Author(s)

Howard Bloom

The various activities of the National Institute of Standards and Technology (NIST) in the development of a Product Data Exchange Standard (PDES) will be...

A Modular Architecture for a Process Planning Systems

October 1, 1989

Author(s)

M Browning

At the National Institute of Standards and Technology, the automation of small batch manufacturing has been a topic of research since 1981. The work has...

Absorber Characterization

October 1, 1989

Author(s)

D P. Kremer, Allen C. Newell, D. A. Agee

Comparison of Antenna Boresight Measurements Between Near-Field and Far-Field Ranges

October 1, 1989

Author(s)

Allen C. Newell, Jeffrey R. Guerrieri, R. R. Persinger, J. A. Stiles, E. J. Mcfarlane

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