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MMIC Related Metrology at the National Institute of Standards and Technology

Published

Author(s)

Gerome R. Reeve, Roger Marks, David L. Blackburn
Proceedings Title
Proc., IEEE Instrum. Meas. Tech. Conf.
Conference Dates
February 13-15, 1990
Conference Location
San Jose, CA

Citation

Reeve, G. , Marks, R. and Blackburn, D. (1990), MMIC Related Metrology at the National Institute of Standards and Technology, Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA (Accessed November 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 31, 1990, Updated October 12, 2021