TY  - CONF
AU  - Gerome Reeve
AU  - Roger Marks
AU  - David Blackburn
C2  - Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA
DA  - 1990-02-01 00:02:00
LA  - en
PB  - Proc., IEEE Instrum. Meas. Tech. Conf., San Jose, CA
PY  - 1990
TI  - MMIC Related Metrology at the National Institute of Standards and Technology
ER  -