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Conferences

Planar Silicon Photosensors: An Overview

December 31, 1990

Author(s)

Jon Geist, A. R. Schaefer

Orbital and Spin Anisotropy of Conduction Electrons in InSb

December 31, 1990

Author(s)

Chris L. Littler, I. T. Yoon, X. N. Song, W. Zawadzki, P. Pfeffer, David G. Seiler

Comparison of High-Resistivity Measurements of Silicon by AC Impedance, DC Resistance, van der Pauw, and Four-Probe Methods, Extended Abstract

December 31, 1990

Author(s)

W. R. Thurber, James R. Ehrstein, J R. Lowney

Microstructural Evolution of Oxides During Processing of Oxygen Implanted SOI Material

December 31, 1990

Author(s)

S. J. Krause, S. Visitserngtrakul, B. F. Cordts, Peter Roitman

Bound Hole Excitations in p-Hg_0.76Cd_0.24Te

December 31, 1990

Author(s)

Chris L. Littler, M. R. Loloee, W. Zawadzki, David G. Seiler

Hybrid Construction of Multijunction Thermal Converters

December 31, 1990

Author(s)

Joseph R. Kinard Jr., D. X. Huang, Donald B. Novotny

Knowledge Extraction Techniques for Expert System Assisted Wafer Screening

December 31, 1990

Author(s)

D. Khera, Michael W. Cresswell, Loren W. Linholm, G. Ramanathan, J. Buzzeo, A. Nagarajan

Effect of Annealing Ambient on the Precipitation Processes in Oxygen-Implanted Silicon-on-Insulator Material, Extended Abstract

December 31, 1990

Author(s)

Peter Roitman, David S. Simons, S. Visitserngtrakul, C. O. Jung, S. J. Krause

Extended Transfer Hamiltonian Method for Resonant Tunneling

December 10, 1990

Author(s)

S Apell, E Albertsson, David R. Penn

Time-Dependent Local Mass Rate of Finite-Thickness Burning Walls of PMMA.

December 1, 1990

Author(s)

A K. Kulkarni, C I. Kim, Henri E. Mitler

Permittivity Measurements on Molecular-Sized Samples, Extended Abstract

December 1, 1990

Author(s)

A. van Roggen, L. Yuwono, Hui Zhou, Paul H. Meijer, Joseph Kopanski

Reconstruction During Camera Fixation

November 30, 1990

Author(s)

Daniel Raviv

Three-Dimensional Position Determination from Motion

November 30, 1990

Author(s)

M Nashman, K Chaconas

NASA

Polarized-Electron--Polarized-Atom Scattering

November 23, 1990

Author(s)

Michael H. Kelley, Jabez J. McClelland, Steven R. Lorentz, Robert Celotta

Evolution of the Flight Telerobotic Servicer

November 20, 1990

Author(s)

Ronald Lumia

Approach to a System Architecture for Post Office Automation

November 7, 1990

Author(s)

James S. Albus, Edward J. Barkmeyer Jr., Albert T. Jones

Laboratory Studies of Smoke Properties at NIST Past, Present, and Future

November 1, 1990

Author(s)

George W. Mulholland, Nelson P. Bryner

Burn facilities have been developed at NIST to measure the yield and optical properties of smoke at two fire scales. The small scale apparatus is used for...

The Interpretation and Use of S-Parameters in Lossy Lines

November 1, 1990

Author(s)

Dylan F. Williams, Roger Marks

Although a fundamental parameter of transmission lines, the characteristic impedance is difficult to measure accurately. We suggest a method by which it may be...

Progress Toward MMIC On-Wafer Standards

November 1, 1990

Author(s)

Dylan F. Williams, Roger Marks, K. R. Phillips, T. Miers

A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the...

Multi-Line Calibration for MMIC Measurement

November 1, 1990

Author(s)

Roger Marks

MMIC Package Characterization with Active Loads

November 1, 1990

Author(s)

K. R. Phillips, Dylan Williams

Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately...

Collisional Electron-Detachment and Ion Conversion Processes in SF6

November 1, 1990

Author(s)

James K. Olthoff, Richard J. Van Brunt, Yicheng Wang, L. D. Doverspike, R. Champion

Analysis of Optical Flow Estimation Using Epipolar Plane Images

November 1, 1990

Author(s)

R Rangachar, Tsai H. Hong, Martin Herman, R Luck

Comments Concerning On-Wafer FMQ Parameter Measurements

November 1, 1990

Author(s)

D. F. Wait

A Closed-Form Massively-Parallel Range-From-Image-Flow Algorithm

October 31, 1990

Author(s)

Daniel Raviv, James S. Albus

Sensitivity of Ellipsometric Modeling to the

October 31, 1990

Author(s)

Deane Chandler-Horowitz, Jay F. Marchiando, M. G. Doss, S. J. Krause, S. Visitserngtrakul

Heat Release Rate: The Single Most Important Variable in Fire Hazard

October 20, 1990

Author(s)

Vyto Babrauskas, Richard Peacock

Heat release rate measurements are sometimes seen by manufacturers and product users as just another piece of data to gather. It is the purpose of this paper to...

Evaluation of Dual-Port Circularly Polarized Probes for Planar Near-Field Measurements

October 1, 1990

Author(s)

Michael H. Francis, Katherine MacReynolds

Experimental and Theoretical Probe Position Error Correction in Near-Field Antenna Measurements

October 1, 1990

Author(s)

Lorant A. Muth, Allen C. Newell, R L. Lewis, Seturnino Canales, D P. Kremer

Transition From Trichel-Pulse Corona to Dielectric Barrier Discharge

October 1, 1990

Author(s)

S. V. Kulkarni, Richard J. Van Brunt, V. K. Lakdawala

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