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Conferences

Progress Toward MMIC On-Wafer Standards

Author(s)
Dylan F. Williams, Roger Marks, K. R. Phillips, T. Miers
A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the

MMIC Package Characterization with Active Loads

Author(s)
K. R. Phillips, Dylan Williams
Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately

The NIST STEP Class Library STEP Into the Future

Author(s)
Michael Mclay, KC Morris
This paper describes a C++ class library that implements the Standard for the Exchange of Product Model Data (STEP). The STEP Class Library (SCL) is under
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