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Conferences

Quantum Measurements of Trapped Ions

Author(s)
Wayne M. Itano, James C. Bergquist, John J. Bollinger, J M. Gilligan, D J. Heinzen, F L. Moore, M G. Raizen, David J. Wineland

Apparel Product Data Exchange Standard

Author(s)
Yung-Tsun T. Lee
The apparel industry is increasingly reliant on computer technologies to support activities throughout the product life cycle. As computers become more widely

Usinf the ALPS Process Plan Model

Author(s)
Steven R. Ray
There is a need in the industrial manufacturing community for a general-purpose model to represent hierarchical process plans with the power to express concepts

Diode Lasers and Metrology

Author(s)
Richard W. Fox, G C. Turk, N Mackie, T Zibrova, S Waltman, J. H. Marquardt, A S. Zibrov, C S. Weimer, Leo W. Hollberg, M P. Sassi

An Architecture for Manufacturing Systems Integration

Author(s)
M. K. Senehi, S Wallace, Mark E. Luce
The MIST project is developing a system architecture that incorporates an integrated production planning and control environment. The architecture is composed