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Conferences

Quantum Mechanics with One, Two, and Many Atoms

January 1, 1994

Author(s)

Wayne M. Itano, James C. Bergquist, John J. Bollinger, David J. Wineland

Scanning Electron Microscope Metrology

January 1, 1994

Author(s)

Michael T. Postek

During the manufacturing of present-day integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high

Effects of metallicity on chromospheric emission in cool giants: Results from acoustic wave models

January 1, 1994

Author(s)

M Cuntz, P Ulmschneider

Minimizing Time Dilation Shift in Penning Trap Atomic Clocks

January 1, 1994

Author(s)

Joseph N. Tan, John J. Bollinger, David J. Wineland

Sleuthing the dynamo: HST/FOS observations of the UV emission of solar-type stars in young galactic clusters

January 1, 1994

Author(s)

T R. Ayres, A Brown, J L. Linsky

Neutron-Induced Charged-Particle Emission Studies Below 100 MeV at WNR

January 1, 1994

Author(s)

R C. Haight, T M. Lee, S M. Sterbenz, Fred B. Bateman, S M. Grimes, R Pedroni, V Mishra, N Boukharouba, F C. Goeckner, O A. Wasson, Allan D. Carlson, C M. Bartle, P Maier-komar, H Vonach

Integrated-Optical Devices in Rare-Earth-Doped Glass

January 1, 1994

Author(s)

K. J. Malone

Diode Lasers for Precision Spectroscopy of Calcium

January 1, 1994

Author(s)

C S. Weimer, V L. Velichansky, Richard W. Fox, A S. Zibrov, Leo W. Hollberg

Alpha-Particle Emission from Carbon Bombarded with Neutrons Below 30 MeV, ed. by J.K. Dickens

January 1, 1994

Author(s)

R C. Haight, T M. Lee, S M. Sterbenz, Fred B. Bateman, S M. Grimes, R Pedroni, N Boukharouba, F C. Goeckner, C E. Brient, O A. Wasson, H Vonach

Mode Coupling and Loss on Tapered Optical Waveguides

January 1, 1994

Author(s)

R. L. Gallawa, A. R. Kumar, A. Weisshar

Fundamental Limits on the Instabilities of BAW Quartz Oscillators

January 1, 1994

Author(s)

J R. Vig, F L. Walls

International Collaboration in Measurement of Differential Nuclear Data for Energy Applications in the Frame of the NEA Nuclear Science Committee

January 1, 1994

Author(s)

A Deruytter, H Weigmann, Allan D. Carlson, D Smith

Correlation of Optical, X-Ray, and Electron Microscopy Measurements on Semiconductor Multilayer Structures

January 1, 1994

Author(s)

David H. Christensen, Robert K. Hickernell, D. T. Schaafsma, Joseph G. Pellegrino, M. J. McCollum, J. R. Hill, R. S. Rai

Microwave Leakage as a Source of Systematic Error and Long-Term Instability in Cesium Atomic Beam Frequency Standards

January 1, 1994

Author(s)

W D. Lee, John P. Lowe, Jon H. Shirley, Robert E. Drullinger

Angular Variation of the Personal Dose Equivalent, H_p(0.07), for Beta Radiation and Nearly Monoenergetic Electrons: Preliminary Results

January 1, 1994

Author(s)

T A. Da silva, Christopher G. Soares

Optical Sampling Using Nondegenerate Four-Wave Mixing in a Semiconductor Laser Amplifier

January 1, 1994

Author(s)

M. Jinno, John B. Schlager, Douglas L. Franzen

Determining the Velocity Distribution of Atomic Beams by Gated Optical Pumping

January 1, 1994

Author(s)

W D. Lee, Jon H. Shirley, Robert E. Drullinger

Variable Groove Spaced Grating Monochromators for Synchrotron Light Sources,

January 1, 1994

Author(s)

M Haass, J -. Jia, T A. Callcott, D L. Ederer, K E. Miyano, R N. Watts, D R. Mueller, Charles Tarrio, E Morikawa

Measurement and Simulation of Photoluminescence Spectra from Vertical-Cavity Quantum-Well Laser Structures

January 1, 1994

Author(s)

D. T. Schaafsma, Robert K. Hickernell, David H. Christensen

A Study of the Surface Texture of Polycrystalline Phosphor Films Using AFM

January 1, 1994

Author(s)

Zsolt R?vay, J Schneir, D Brower, John S. Villarrubia, Joseph Fu, et al

Stimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the

Relationship of AM to PM Noise in Selected rf and Microwave Oscillators

January 1, 1994

Author(s)

E S. Ferre, L M. Nelson, F G. Ascarrunz, F L. Walls

Feature Recognition for Manufacturability Analysis

January 1, 1994

Author(s)

William Regli, Satyandra K. Gupta, D Nau

While automated recognition of features has been attempted for a wide range of applications, no single existing approach possesses the functionality required to

A Polarization Insensitive 3x3 Sagnac Current Sensor Using Polarizing Spun High-Birefringence Fiber

January 1, 1994

Author(s)

I. G. Clarke, Kent B. Rochford, Allen Rose, Gordon W. Day

Can Displays Deliver a Full Measure?: Manufacturing

January 1, 1994

Author(s)

Herbert S. Bennett, Charles D. Fenimore, B. F. Field, Edward F. Kelley

Tunable Phase-Locked Diode Lasers for Precision Spectroscopy

January 1, 1994

Author(s)

L D. D'evelyn, Leo W. Hollberg, Richard W. Fox, Z B. Popovic

A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards

January 1, 1994

Author(s)

John R. Stoup, Theodore D. Doiron

NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer

Efficient Vector Solution for Optical Waveguides Using Galerkin's Method with Hermite-Gauss Basic Functions

January 1, 1994

Author(s)

Andreas Weisshaar, J Li, R. L. Gallawa

Refraction of Light by Graded Birefringent Media

January 1, 1994

Author(s)

Ken L. Stricklett, C. Sununu

A CWP Phase-Lock Loop for Diode-Laser Stabilization

January 1, 1994

Author(s)

L D'evelyn, Leo W. Hollberg, Z B. Popovic

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994

Author(s)

William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague

Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the

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