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Conferences

The Geometric Characterization of Rockwell Diamond Indenters

Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell

Fabricating Nanostructures Using Optical Forces on Atoms

Author(s)
R Gupta, R E. Scholten, Jabez J. McClelland, Robert Celotta
We have demonstrated the use of the optical dipole force in a standing wave to focus chromium atoms into narrow lines as they deposit onto a silicon substrate

A Calibrated Atomic Force Microscope

Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and
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