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Conferences

Demonstration: World Wide Web for Distribution of Users Group Information on Internet

May 1, 1994

Author(s)

Curtis H. Parks

The Multi-State Two-Port: An Alternative Transfer Standard

May 1, 1994

Author(s)

G F. Engen, Robert M. Judish, John R. Juroshek

Characterization of the Emission from 2D Array Josephson Oscillators

May 1, 1994

Author(s)

P. A. Booi, Samuel Benz

Programmable Impedance Transfer Standard to Support LCR Meters

May 1, 1994

Author(s)

Nile M. Oldham, S. R. Booker

Quantification of Temporal Threshold Noise in TV Display

May 1, 1994

Author(s)

S. Herman, B. F. Field, Paul A. Boynton

Electrical Sensors for Monitoring rf Plasma Sheaths

May 1, 1994

Author(s)

Mark A. Sobolewski, James K. Olthoff

Phase Plane Compensation of the NIST Sampling Comparator System

May 1, 1994

Author(s)

J. P. Deyst, T. M. Souders

Binary vs Decade Inductive Voltage Divider Comparison and Error Decomposition

May 1, 1994

Author(s)

S. Avramov, Gerard N. Stenbakken, Andrew D. Koffman, Nile M. Oldham, R W. Gammon

Bounds on Least-Squares Four-Parameter Sine-Fit Errors Due to Harmonic Distortion and Noise

May 1, 1994

Author(s)

J. P. Deyst, T. M. Souders, O. M. Solomon

Display Modeling and an AMLCD Model on a Video Supercomputer

May 1, 1994

Author(s)

Edward F. Kelley, B. F. Field, George R. Jones Jr., Paul A. Boynton

Photoreflectance Study of the Chemically Modified (100) GaAs Surface

May 1, 1994

Author(s)

John A. Dagata, O Glembocki, J Tuchman, K Ko, S Pang

Photoreflectance (PR) spectroscopy has been used to study the Fermi-level pinning position of chemically modified (100) GaAs surfaces. It is shown that there...

An Instrument for Calibrating Atomic Force Microscope Standards

May 1, 1994

Author(s)

J Schneir, T Mcwaid, Theodore V. Vorburger

To facilitate the use of AFMs for manufacturing we have initiated a project to develop and calibrate artifacts which can in turn be used to calibrate a...

A Monte Carlo Model for SEM Linewidth Metrology

May 1, 1994

Author(s)

J R. Lowney, Michael T. Postek, Andras Vladar

A scanning electron microscope (SEM) can be used to measure the dimensions of the microlithographic features of integrated circuits. However, without a good...

Electrical Test Structure for Overlay Metrology Referenced to Absolute Length Standards

May 1, 1994

Author(s)

Michael W. Cresswell, William B. Penzes, Robert Allen, L Linholm, C Ellenwood, E C. Teague

This test structure is based on the voltage-dividing potentiometer principle and was originally replicated in a single lithography cycle to evaluate feature...

Comparison of UV-Induced Fluorescence and Bragg Grating Growth in Optical Fiber

May 1, 1994

Author(s)

Sarah L. Gilbert, H. Patrick

The NIST Advanced Machine Tool Structures Testbed

April 29, 1994

Author(s)

Albert J. Wavering, Ronald Lumia

Control, AMRF, Metrology

Correlated Run length Algorithm (CURL) for detecting form structure within digitized documents.

April 12, 1994

Author(s)

Michael D. Garris

Dielectric Properties of Thin Film SrTiO₃ Grown on LaAlO₃ with YBa₂Cu₃O_7-x Electrodes

April 7, 1994

Author(s)

Hanchang F. Wu, F. S. Barnes, D. Galt, J. Price, James A. Beall

High Speed Sensor - Control Interfaces

April 1, 1994

Author(s)

Thomas E. Wheatley

Open-Ended Coaxial Probes for Nondestructive Testing of Substrates and Circuit Boards

April 1, 1994

Author(s)

James R. Baker-Jarvis, Michael D. Janezic

Dielectric Properties of Thin Film STO Grown on LAO with YBCO Electrodes

April 1, 1994

Author(s)

Hanchang F. Wu, F. S. Barnes, D. Galt, J. Price, James A. Beall

Faraday Effect Sensors for Magnetic Field and Electric Current

April 1, 1994

Author(s)

Gordon W. Day, M. N. Deeter, Allen Rose, Kent B. Rochford

A Stewart Platform Lunar Rover

March 3, 1994

Author(s)

Roger V. Bostelman, James S. Albus, Karl Murphy, T M. Tsai, E Amatucci

A lunar version of the Robocrane is being developed at the Robot Systems Division of the National Institute of Standards and Technology (NIST) to address the...

Guide to the Expression of Uncertainty in Measurement: A Status Report

March 1, 1994

Author(s)

Barry N. Taylor, C Kuyatt

Lightwave Standards Development at NIST

March 1, 1994

Author(s)

Douglas L. Franzen

Symbolic Programming With Series Expansions: Applications to Optical Waveguides

March 1, 1994

Author(s)

R. L. Gallawa, A. R. Kumar, Andreas Weisshaar

Classification and treatment of errors in reference mass spectra

February 27, 1994

Author(s)

Anzor I. Mikaia, S G. Lias, Stephen E. Stein

Requirements to reference spectra and criteria for mass spectrum inclusion, modification and deletion are developed as a result of evaluation of thousands of...

Laser Imaging of Chemistry-Flowfield Interactions: Enhanced Soot Formation in Time-Varying Diffusion Flames

January 27, 1994

Author(s)

J E. Harrington, C. R. Shaddix, K C. Smyth

Models of detailed flame chemistry and soot formation are based upon experimental results obtained in steady, laminar flames. For successful application of...

Cryogenic Precision Capacitance Bridge Using a Single Electron Tunneling Electrometer

January 1, 1994

Author(s)

R. N. Ghosh, Alan F. Clark, B. A. Sanborn, Edwin R. Williams

A Revised Uncertainty Analysis for the NIST 30-MHz Attenuation Calibration System

January 1, 1994

Author(s)

Jeffrey A. Jargon

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