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Improvements to Automated System for Measuring Standard Resistors at NIST

Published

Author(s)

Dean G. Jarrett, T. P. Moore
Proceedings Title
Proc. 1994 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 31-August 4, 1994
Conference Location
Chicago, IL, USA

Citation

Jarrett, D. and Moore, T. (1994), Improvements to Automated System for Measuring Standard Resistors at NIST, Proc. 1994 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Chicago, IL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11513 (Accessed March 4, 2024)
Created June 30, 1994, Updated October 12, 2021