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Conferences

A VRML Integration Methodology for Manufacturing Applications

Author(s)
Sanford P. Ressler, Afzal A. Godil, Quandou (. Wang, G S. Seidman
This paper describes several methods for using the Virtual Reality Modeling Language (VRML) as the visualization integration tech-nology for manufacturing...

Reliability of Conformance Tests

Author(s)
Robert C. Hagwood, Raghu N. Kacker, James H. Yen, D L. Banks, Lynne S. Rosenthal, Leonard J. Gallagher, Paul E. Black
A conformance test is a software assurance test that is applied in order to determine if specification requirements of the software are being met. It is a time...

NIST Atomic Spectra Database (1998)

Author(s)
Daniel E. Kelleher, William C. Martin, Wolfgang L. Wiese, J Sugar, Craig J. Sansonetti, Jeffrey R. Fuhr, Joseph Reader, Arlene Musgrove, Karen J. Olsen, Peter J. Mohr, G R. Dalton

Mobile Streams

Author(s)
Mudumbai Ranganathan, L S. Andrey, V Schaal
A large class of distributed testing, control and collaborative applications are reactive or event driven in nature. Such applications can be structured as a...

Analysis of Sea-Floor Earthquake Data

Author(s)
C E. Smith, D M. Boore
The Minerals Management Service (MMS), in cooperation with several oil and gas companies, installed a seismometer network on the ocean floor in the Santa...

Data Selection for Broadcast News CSR Evaluations

Author(s)
W M. Fisher, Walter S. Liggett Jr, A N. Le, Jonathan G. Fiscus, D S. Pallett
Composition of the 1997 Hub-4 broadcast news test set is discussed. The composition is based on concurrent selection of a statistically equivalent test set for...

Atomic And Molecular Data And Their Applications

Author(s)
Wolfgang L. Wiese
The first International Conference on Atomic and Molecular Data And Their Applications (ICAMDATA) took place at the National Institute of Standards and...

A Robust Ontology for Manufacturing Systems Integration

Author(s)
Amy Knutilla, Craig I. Schlenoff, Robert W. Ivester
In all types of communication, the ability to share information is often hindered because the meaning of information can be drastically affected by the context...

Scanning Height for ANSI C63.5 Calibrations

Author(s)
Kenneth H. Cavcey, Dennis G. Camell
The configuration of antennas at an Open Area Test site (OATS) for calibrations results in constructive and destructive electric fields. Regardless of the...

The Next Generation of the NIST Watt Balance

Author(s)
David B. Newell, Richard L. Steiner, Edwin R. Williams, Alain Picard
Reduction in the total uncertainty of the NIST Watt Balance is limited by the present configuration of the experiment. Most of the major relative uncertainty...

Reflection Measurement Problems Arising from Haze

Author(s)
George R. Jones Jr., Edward F. Kelley
Irreproducibility in some reflection measurement methods arises from the observance of the haze component of reflection (non-regular-specular, non-Lambertian)...
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