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Conferences

Phase Field Modeling of Solidification Under Stress

Author(s)
Julia Slutsker, Alexander L. Roytburd, James A. Warren, Geoffrey B. McFadden, William J. Boettinger
A phase-field model that includes stress field during non-isothermal solidification of a one-component system has been developed. The model has been applied to

Refractometry Using a Helium Standard

Author(s)
Jack A. Stone Jr., Alois Stejskal
The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore

NIST Impulse Spectrum Amplitude Measurement Service

Author(s)
Nicholas Paulter, Donald R. Larson
The NIST service for measuring the impulse spectrum amplitude of the output of impulse generators is described. The calibration procedures used in this

Retrieval Evaluation with Incomplete Information

Author(s)
C E. Buckley, Ellen M. Voorhees
This paper examines whether the Cranfield evaluation methodology is robust to gross violations of the completeness assumption (i.e., the assumption that all

1 A and 120 mA Thin-Film Multijunction Thermal Converters

Author(s)
H. Laiz, Thomas F. Wunsch, Joseph R. Kinard Jr., Thomas E. Lipe Jr.
We report on the development of thin-film multijunction thermal converters for the measurement of ac current. The materials and designs chosen for these devices

A Unified Framework for Mobile Device Security

Author(s)
Wayne Jansen, Vlad Korolev, Serban I. Gavrila, T Heute, Clement Seveillac
Present-day handheld devices, such as PDAs, are a useful blend of hardware and software oriented toward the mobile workforce. While they provide the capability
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