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Conferences

Panoramic, Ultrawideband, Diagnostic Imaging of Test Volumes

Author(s)
David R. Novotny, Robert T. Johnk, Chriss A. Grosvenor, Seturnino Canales
This paper presents developing methodologies to assess the quality and range of use (in frequency, test volume size, and test type) of EMC test facilities...

A Failure Analysis of an Experimental AIMgB14 Cutting Tools

Author(s)
J L. Evans, Laurent Deshayes, D G. Bhat, S A. Batzer
A recently developed ultra-hard boride-based material, AlMgB14, has been fabricated into a standard cutting tool geometry (TPG-222) and tested in the single...

Smart Machining Systems: Issues and Research Trends

Author(s)
Laurent Deshayes, Lawrence A. Welsch, Alkan Donmez, Robert W. Ivester, David E. Gilsinn, Richard L. Rhorer, Eric P. Whitenton, Florian Potra
Smart Machining Systems (SMS) should be an important part of Life Cycle Engineering (LCE) since its capabilities are: producing the first and every product...

Measurements of phase shifts in an inertance tube

Author(s)
Michael A. Lewis, Peter E. Bradley, Ray Radebaugh, Ercang Lou
Phase shifts and mass flows were measured at the inlet of an inertance tube. and the results are compared with transmission line models. The mass flow rates at...

Superconductors: An Emerging Power Technology

Author(s)
John (Jack) W. Ekin
Superconductors offer effectively zero resistance to the flow of electricity and thus have the potential to significantly reduce Joule energy losses in the...

FORENSIC STUDY OF THE STEEL IN THE WORLD TRADE CENTER

Author(s)
Thomas A. Siewert, Joseph D. McColskey, Christopher N. McCowan, Frank W. Gayle, William E. Luecke, Stephen W. Banovic, Timothy J. Foecke, Richard J. Fields
In September of 2002, the National Institute of Standards and Technology began a two-year investigation into the World Trade Center (WTC) disaster of September...

Microfabricated Atomic Clocks at NIST

Author(s)
Svenja A. Knappe, P Schwindt, Vladislav Gerginov, V Shah, Leo W. Hollberg, John E. Kitching, Li-Anne Liew, John Moreland
In this paper we present the latest progress in the development, fabrication, and characterization of a microfabricated atomic frequency reference at NIST. With...
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