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Conferences

Linewidth Measurement from a Stitched AFM Image

January 1, 2005

Author(s)

Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger, C Nguyen

Image stitching is a technique that combines two or more images to form one composite image, which provides a field of view that the originals cannot. It has...

New Capabilities At NIST In Dimensional Metrology

January 1, 2005

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Bryon S. Faust, John R. Stoup, Mary Abbott

A number of new or revised services in dimensional metrology are presented. Included are: a lower cost, high accuracy calibration for sphere diameter; reduced...

Standardized Interfaces and WEB Enablement for Homeland and Security Sensor Networks

January 1, 2005

Author(s)

Kang B. Lee, Mark E. Reichardt

Sensors and networks, both wired and wireless, are key components in building distributed sensor networks nation-wide for monitoring and protecting critical...

Combinatorial Methods for the Characterization of Dental Materials

January 1, 2005

Author(s)

Sheng Lin-Gibson, Elizabeth A. Wilder, Forrest A. Landis, Peter Drzal

Quantitative Analysis of a Candidate Porosity Reference Scaffold: Type 1

January 1, 2005

Author(s)

Joy P. Dunkers, John A. Tesk, David Dean, M Cooke, Richard Ketcham, Marcus T. Cicerone

2005 Variable Pressure/Environmental Scanning Electron Microscopy: Application to Photomask Dimensional Metrology

January 1, 2005

Author(s)

Michael T. Postek

2005 Metrology for a New Science: Advanced Metrology Needs

January 1, 2005

Author(s)

Michael T. Postek

Advanced Metrology Needs for Nanotechnology and Nanomanufacturing

January 1, 2005

Author(s)

Michael T. Postek

Elastic Instability of Multilayer Films Coated on Substrates

January 1, 2005

Author(s)

Shu Guo, Martin Y. Chiang, Christopher M. Stafford

Mechanical properties of ultra-thin (submicrometer) films coated on a substrate are paramount in many applications. One question arises as to whether the...

Stress Analysis for Combinatorial Buckling-Based Metrology of Thin Film Modulus

January 1, 2005

Author(s)

Shu Guo, Christopher M. Stafford, Martin Y. Chiang

We recently reported on a new buckling-based metrology for probing the elastic modulus of thin polymer films. In this experimental geometry, a thin film of...

Scanning Tunneling Spectroscopy of End States in 1-D Atom Chains

January 1, 2005

Author(s)

Jason Crain, Daniel T. Pierce

Fermionic condensates, ed. by L. G. Marcassa

January 1, 2005

Author(s)

M Greiner, C A. Regal, D S. Jin

The Potential Role of Enhanced LORAN-C in the National Time and Frequency Infrastructure

January 1, 2005

Author(s)

Michael A. Lombardi, Thomas P. Celano, E D. Powers

Microfab-ricated Atomic Frequency References

January 1, 2005

Author(s)

Svenja A. Knappe, Peter D. Schwindt, V Shah, Leo W. Hollberg, John E. Kitching, Li-Anne Liew, John Moreland

Microfabricated Atomic Clocks and Magnetometers

January 1, 2005

Author(s)

Svenja A. Knappe, Peter D. Schwindt, Vladislav Gerginov, V Shah, Hugh Robinson

-Optical Oscillators with High Stability and Low Timing Jitter,-

January 1, 2005

Author(s)

Leo W. Hollberg, Christopher W. Oates, Scott A. Diddams

Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic

January 1, 2005

Author(s)

Benjamin K. Tsai, D P. DeWitt, E A. Early, Leonard M. Hanssen, Sergey Mekhontsev, Matthias Rink, K G. Kreider, B J. Lee, Z M. Zhang

Near infrared indirect emissivity measurements and system employing a vacuum goniometer, ed. by D. Zvizdic

January 1, 2005

Author(s)

Matthias Rink, V B. Khromchenko, Sergey Mekhontsev, Leonard M. Hanssen

A Flexible Bandpass Correction Method for Spectrometers, ed. by, J.L. Nieves and J.H-Andres

January 1, 2005

Author(s)

Yoshihiro Ohno

New NIST Reference Goniospectrometer, ed. by Hanssen, L.M., Farrell, P.V.

January 1, 2005

Author(s)

Gael Obein, Robert R. Bousquet, Maria E. Nadal

Summary of NIST Short Courses offered by the Optical Technology Division

January 1, 2005

Author(s)

Carl C. Miller, Howard W. Yoon, Bettye C. Johnson, Yoshihiro Ohno

General Practice for the Measurement of Flashing Lights

January 1, 2005

Author(s)

Carl C. Miller, Wendy L. Davis, S E. Lee, R E. Gibbons, Yoshihiro Ohno

Emissivity evaluation of fixed point blackbodies, ed. by D. Zvizdic

January 1, 2005

Author(s)

Sergey Mekhontsev, V B. Khromchenko, Alexander Prokhorov, Leonard M. Hanssen

Comparison of direct and indirect methods of spectral infrared emittance measurement, ed. by D. Zvizdic

January 1, 2005

Author(s)

Leonard M. Hanssen, Alexander Prokhorov, V B. Khromchenko, Sergey Mekhontsev

Particle Size Metrology: Comparison Between Aerosol Electrical Mobility and Laser Surface Light Scattering Techniques, ed. by D.G. Seiler, A.C. Diebold, R. McDonald, C.R. Ayre, R.P. Khosla, S. Zollner, and E.M. Secula

January 1, 2005

Author(s)

Thomas A. Germer, G W. Mulholland

Spectral Matching with and LED-Based Spectrally Tunable Source

January 1, 2005

Author(s)

Irena Fryc, Steven W. Brown, Yoshihiro Ohno

Generation of correlated photon pairs in a microstructure fiber, ed. by R.E. Myers and Y. Shih

January 1, 2005

Author(s)

Jingyun Fan, Alan L. Migdall

Ultrafast Transient THz Spectroscopy of Azobenzene

January 1, 2005

Author(s)

Okan Esenturk, Edwin J. Heilweil

Toward an improved color rendering metric, ed. by I.T. Ferguson, J.C. Carrano, Tsunemasa Taguchi, and I.E. Ashdown

January 1, 2005

Author(s)

Wendy L. Davis, Yoshihiro Ohno

NIST Reference Colorimeter

January 1, 2005

Author(s)

Robert R. Bousquet, Maria E. Nadal, Gael Obein

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